Nouvelle methode de quantification des orientations cristallines par figures de poles haute resolution et ultra-rapides

摘要

An improved method for texture characterization has been developed for heavy textured specimens (thin films, twins, single crystals, etc.), using a new high resolution X-Ray pole figure technique with a high speed measurement. An adaptive hemispheric scanning and a data treatment using digital image processing has been implemented for both diffractometer correction and automatic texture quantification. This method is linked to a new high resolution FDOC determination associated with the DOSOPHATEX system.