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Durable ultraviolet sensors using highly oriented diamond films

机译:使用高度定向的金刚石薄膜的耐用型紫外线传感器

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摘要

We fabricated vacuum ultraviolet (VUV) sensors using highly oriented diamond (HOD) films and studied their long-term stability to evaluate the feasibility of the sensors for practical use. The sensors are composed of a pair of interdigitated Pt electrodes on the HOD film surfaces, and sealed in the industrially standard can packages. Xenon (Xe) excimer lamps lambda= 172 nm) and low-pressure mercury (Hg) lamps (1= 185 nm) were used as the radiation sources. It was demonstrated that the output signal of the sensors is reproducible and stable over 700 h under the intense VUV irradiation from Xe excimer lamps. The results of low-pressure Hg lamp measurements showed that the sensors were sensitive only to the 185-nm radiation irrespective of the presence of the 254-nm radiation that is five to ten times more intense than the 185-nm radiation. It is thus concluded that the present HOD film sensors make possible a continuous monitoring of the intense VUV radiation sources, and can be applicable to dry cleaning of silicon wafers or glass substrates in semiconductor industry and flat panel display manufacturing processes, respectively.
机译:我们使用高度取向的金刚石(HOD)膜制造了真空紫外线(VUV)传感器,并研究了其长期稳定性,以评估该传感器在实际使用中的可行性。传感器由HOD薄膜表面上的一对叉指式Pt电极组成,并密封在工业标准罐头包装中。氙(Xe)准分子灯(λ= 172 nm)和低压汞(Hg)灯(1 = 185 nm)被用作辐射源。结果表明,在氙气准分子灯强烈的紫外线照射下,传感器的输出信号在700 h内可再现且稳定。低压汞灯测量的结果表明,无论是否存在比185 nm辐射强度高五到十倍的254 nm辐射,传感器仅对185 nm辐射敏感。因此可以得出结论,本发明的HOD膜传感器使得可以连续监测强烈的VUV辐射源,并且可以分别应用于半导体工业和平板显示器制造工艺中的硅晶片或玻璃基板的干洗。

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