Optimised contact-structures for metal-diamond-metal UV-detectors

摘要

UV detection performances of planar metal-diamond-metal devices have been analysed as a function of the distance between the two metal contacts. In particular, underlying the importance of the penetration depth of electric field lines, it is shown that good characteristics are obtained by means of a contact distance comparable to the absorption length of UV photons to be detected. In addition, the importance of chemical treatment in a sulphochromic mixture, able to reduce leakage current in the planar contact configuration, is also discussed.