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CVD diamond nucleation enhanced by ultrasonic pretreatment using diamond and mixture of diamond and TaC powders

机译:通过使用金刚石以及金刚石和TaC粉末的混合物进行超声预处理可以增强CVD金刚石成核

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摘要

Effects of ultrasonic pretreatment on chemical vapor deposition (CVD) diamond nucleation on Si substrates were systematically studied. Pure 1.5-40 mum-diamond powder and mixtures of 1.5-5 mum-diamond as well as 5-20 mum-Tantalum Carbide (TaC) powder were used in ultrasonic pretreatment. The root-mean-square (Rms) surface roughness of the pretreated substrates, residual diamond and TaC powders left on the substrates were examined using atomic force microscopy (AFM), Raman spectroscopy and X-ray diffraction (XRD), respectively. It was observed that the Rms surface roughness increases with increasing diamond or TaC powder size, and there is some diamond or TaC powder left on the substrates after ultrasonic pretreatment. Diamond films were deposited using microwave plasma chemical vapor deposition (MPCVD) technique and characterized by field emission scanning electron microscop (FE-SEM). It was found that CVD diamond nucleation density strongly depends on particle size of diamond or TaC powder used, the nucleation density increases with increasing diamond or TaC powder size. A mixture of diamond and TaC powders enhances CVD diamond nucleation much more significantly than that of pure diamond powder. A mixture of 1.5 mum-diamond and 20 mum-TaC powders has an equivalent nucleation enhancement efficiency, which could be caused by pure 40 mum-diamond powder.
机译:系统地研究了超声预处理对Si衬底上化学气相沉积(CVD)金刚石成核的影响。在超声波预处理中使用了纯的1.5-40微米金刚石粉末和1.5-5微米金刚石混合物以及5-20微米碳化钽(TaC)粉末。分别使用原子力显微镜(AFM),拉曼光谱和X射线衍射(XRD)检查预处理后的基材的均方根(Rms)表面粗糙度,残留在基材上的残留金刚石和TaC粉末。观察到,随着金刚石或TaC粉末尺寸的增加,Rms表面粗糙度增加,并且在超声预处理之后在基材上残留一些金刚石或TaC粉末。使用微波等离子体化学气相沉积(MPCVD)技术沉积金刚石膜,并通过场发射扫描电子显微镜(FE-SEM)对其进行表征。发现CVD金刚石的成核密度强烈地取决于所使用的金刚石或TaC粉末的粒径,成核密度随金刚石或TaC粉末尺寸的增加而增加。金刚石和TaC粉末的混合物比纯金刚石粉末显着增强CVD金刚石成核作用。 1.5微米钻石粉末和20微米TaC粉末的混合物具有等效的成核效率,这可能是由纯40微米钻石粉末引起的。

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