首页> 外文期刊>Vacuum: Technology Applications & Ion Physics: The International Journal & Abstracting Service for Vacuum Science & Technology >Dielectric characteristics of vacuum circuit breakers with CuCr and CuBi contacts before and after short-circuit breaking operations
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Dielectric characteristics of vacuum circuit breakers with CuCr and CuBi contacts before and after short-circuit breaking operations

机译:短路断开操作前后的带有CuCr和CuBi触点的真空断路器的介电特性

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This paper presents the results of the degree of irreversible changes of dielectric properties of vacuum circuit breakers with CuCr and CuBi contacts before and after short-circuit breaking operations. Tests of dielectric properties were performed on four different types of switching vacuum chamber with RMF electrodes in the form of a spiral disk with slots. The paper describes the configuration of measuring system for determining the dielectric properties of circuit breakers with DC, AC and pulse voltage. It also describes the measuring procedure. The results were analyzed and the experimentally obtained random variable breakdown voltage is found to belong to Weibull distribution in all cases. Based on these results it was found that for the vacuum circuit breakers with CuCr contacts and CuBi breakdown occurs by the emission mechanism after stopping of diffuse arc with the initial breakdown at the anode. It was also found that significant reduction of the breakdown voltage occurs only after a short-circuit current breaking for a constricted arc. Only in this case, the significant difference between circuit breakers with CuBi and CuCr contacts is observed. This difference is explained by the fact that breakdown voltage for a constricted arc strongly depends on the shape of the applied voltage by the action mechanism of micro particles generated during the breaking of the arc current for the vacuum circuit breakers with CuBi contacts and it is caused by material of contacts. The results confirm the lower degree of irreversible changes of dielectric properties of vacuum circuit breakers with CuCr contacts in operation.
机译:本文介绍了短路断开操作前后带有CuCr和CuBi触点的真空断路器的介电性能不可逆变化程度的结果。介电性能的测试是在带有RMF电极的四种不同类型的开关真空室中进行的,该RMF电极为带槽螺旋盘的形式。本文介绍了用于确定直流,交流和脉冲电压的断路器介电性能的测量系统的配置。它还描述了测量程序。分析结果,发现在所有情况下,实验获得的随机可变击穿电压均属于威布尔分布。根据这些结果,发现对于具有CuCr触点和CuBi击穿的真空断路器,在弥散电弧停止且阳极发生初始击穿之后,通过发射机制发生了击穿。还发现击穿电压的显着降低仅在短路电流因电弧收缩而中断后才发生。仅在这种情况下,才能观察到具有CuBi和CuCr触头的断路器之间的显着差异。可以通过以下事实来解释这种差异:对于带有CuBi触点的真空断路器,在电弧电流断开期间产生的细小颗粒的作用机理会导致收缩电弧的击穿电压强烈取决于施加电压的形状,并且这是由于通过接触材料。结果证实了运行中具有CuCr触点的真空断路器的介电性能的不可逆变化程度较低。

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