首页> 外文期刊>CIRP Annals >Sense and non-sense of beam hardening correction in CT metrology
【24h】

Sense and non-sense of beam hardening correction in CT metrology

机译:CT计量中束硬化校正的有意和无意义

获取原文
获取原文并翻译 | 示例
       

摘要

The polychromatic spectrum of X-ray beams causes beam hardening artifacts in reconstructed computed tomography (CT) models. This leads to unwanted grey value variations in CT models, thus hampering accurate material analysis and inspection. Therefore, beam hardening correction algorithms have been developed and improved since the early 1970s, which enhance the CT image quality by compensating for beam hardening effects. However, beam hardening correction often results in less contrast around the edge. In addition, experiments show an increased influence of surrounding material on the object dimensions after segmentation, hence increasing the measurement uncertainty. This paper presents the results of systematic investigations into the effect of beam hardening correction on the measurement accuracy and uncertainty for CT metrology applications.
机译:X射线束的多色光谱在重建的计算机断层扫描(CT)模型中引起束硬化伪影。这会导致CT模型中不必要的灰度值变化,从而妨碍了准确的材料分析和检查。因此,自1970年代初以来,已经开发并改进了射束硬化校正算法,该算法通过补偿射束硬化效应来提高CT图像质量。但是,光束硬化校正通常会导致边缘周围的对比度降低。此外,实验表明,分割后周围材料对物体尺寸的影响增加,因此增加了测量不确定度。本文介绍了系统研究光束硬化校正对CT计量应用的测量精度和不确定度的影响。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号