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Lightning Strikes Back

机译:雷击反击

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摘要

Each year an alarming number of strain gage load cells are destroyed by lightning. In reality, however, very few cells receive direct strikes. Statistical evidence shows that the vast majority of cells supposedly hit by lightning are actually damaged by induced voltages. These voltages can cause the modulus resistors to open like small fuses, or they can cause arcing between the gages and the substrate. In many cases it can be shown that scale indicator power supplies pass line transients onto the excitation lines. It is these transients that are often the source of load cell damage.
机译:每年,数量惊人的应变计称重传感器被雷电破坏。但是实际上,很少有细胞会受到直接打击。统计证据表明,据称受到雷击的绝大多数细胞实际上都被感应电压破坏。这些电压可能会导致模数电阻器像小型保险丝一样断开,或者会导致量规和基板之间产生电弧。在许多情况下,可以显示出刻度指示器电源将线路瞬变传递到励磁线上。这些瞬变通常是称重传感器损坏的根源。

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