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Raman spectrum analysis on the solid-liquid boundary layer of BGO crystal growth

机译:BGO晶体生长固液边界层的拉曼光谱分析

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We study the Raman Spectra Of Bi4Ge3O12 crystal at different temperatures, as well as its melt. The structure characters of the single crystal, melt and growth solid-liquid boundary layer of BGO are investigated by their high-temperature Raman spectra for the first time. The rule of structure change of BGO crystal with increasing temperature is analysed. The results show that there exists [GeO4] polyhedral structure and Bi ion independently in BGO melt. The bridge bonds Bi-O-Bi and Bi-O-Ge appear in the crystal and at the boundary layer, but disappear in the melt. The structure of the growth solid-liquid boundary layer is similar to that of BGO crystal. In the melt, the long-range order structure of the crystal disappears. The thickness of the growth solid-liquid boundary layer of BGO crystal is about 50 mu m.
机译:我们研究了Bi4Ge3O12晶体在不同温度下的拉曼光谱及其熔化情况。首次通过BGO的单晶,熔体和生长固液边界层的结构特征对其高温拉曼光谱进行了研究。分析了BGO晶体随温度升高的结构变化规律。结果表明,BGO熔体中独立存在[GeO4]多面体结构和Bi离子。桥键Bi-O-Bi和Bi-O-Ge出现在晶体中和边界层,但在熔体中消失。生长固液边界层的结构与BGO晶体相似。在熔体中,晶体的长程有序结构消失了。 BGO晶体的生长固液边界层的厚度约为50μm。

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