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Conduction current characteristics and carrier mobility of both original and corona-resistant polyimide films

机译:原始和耐电晕的聚酰亚胺薄膜的导电电流特性和载流子迁移率

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摘要

The electric conduction current characteristics of both Dupont original and corona-resistant polyimide films (100 HN and 100 CR) before and after corona-aging eight hours under electric field of 10 kV/mm and 20kV/mm were measured. The results show that the conduction current of 100 CR is about one order of magnitude larger than that of 100HN. Based on the space charge aging theory, the electric degradation threshold obtained from the space charge limit current plot is 40kV/mm for 100 CR and 35kV/mm for 100HN, and decreases with the increasing corona-aged field. By measuring the depolarization current of the two films at 170 degrees C, it is observed that the decay of depolarization current of 100 CR is faster than that of 100 HN. Based on the depolarization current curve, the apparent carrier mobility and trap depth of 1.2 x 10(-13) m(2)/Vs to 3 x 10(-14) m(2)/VS and 1.052eV to 1.105 eV for 100 CR, 1.12 x 10(-13) m(2)/VS to 8 x 10(-14) m(2)/VS and 1.054 e V to 1.069 eV for 100 HN were, respectively, calculated during depolarizing.
机译:测量了在10 kV / mm和20kV / mm的电场下电晕老化8个小时之前和之后的杜邦原始和耐电晕的聚酰亚胺薄膜(100 HN和100 CR)的导电电流特性。结果表明,100 CR的传导电流比100 HN的传导电流大约大一个数量级。根据空间电荷老化理论,从空间电荷极限电流图获得的电降解阈值对于100 CR为40kV / mm,对于100HN为35kV / mm,并且随着电晕老化场的增加而降低。通过在170摄氏度下测量两个薄膜的去极化电流,可以观察到100 CR的去极化电流的衰减比100 HN的去极化电流快。根据去极化电流曲线,表观载流子迁移率和陷阱深度为100 x 1.2 x 10(-13)m(2)/ Vs至3 x 10(-14)m(2)/ VS和1.052eV至1.105 eV在去极化过程中,分别计算了100 HN的CR,1.12 x 10(-13)m(2)/ VS和8 x 10(-14)m(2)/ VS和1.054 e V至1.069 eV。

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