Silicon on the progress of spot blotch on wheat leaf flag.Original Title Silicio no progresso da mancha marrom na folha bandeira do trigo.

摘要

This study aimed to determine the effect of silicon (Si) on the progress of spot blotch, caused by Bipolaris sorokiniana, on wheat leaf flag. Wheat plants of cultivars BR-18 and BRS-208 were grown in pots containing 0 and 0.30 g Si/kg of soil and inoculated at 45 days after emergence. Spot blotch severity was evaluated at 48, 72, and 96 hours after inoculation and data were used to calculate the area under spot blotch progress curve (AUSBPC). The Si and calcium concentrations on leaf tissue were also determined. The Si concentration on leaf flag of plants supplied with Si was 90.5% higher compared to plants non-supplied with this element. Spot blotch severity was significantly lower on leaf flags of plants supplied with Si at all evaluation times. There was a reduction of 58.5% in AUSBPC on leaf flag of plants supplied with Si. There was no significant difference between -Si and +Si treatments for calcium concentration on leaf tissue. There was no significant difference between the two cultivars for Si concentration on leaf tissue and AUSBPC, but calcium concentration on leaf tissue was higher for cultivar BR-18 than for cultivar BRS-208. The correlation between Si concentration on leaf tissue and AUSBPC was negative (r=-0.59). The results of this study showed a positive effect of Si on increasing wheat leaf flag resistance against infection by B. sorokiniana, considering the importance of this leaf in particular for a gain in yield.