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The complementary use of PIXE-alpha and XRD non-destructive portable systems for the quantitative analysis of painted surfaces

机译:PIXE-alpha和XRD无损便携式系统的互补使用,用于对涂漆表面进行定量分析

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This work presents the results of a non-destructive analysis carried out using the portable PIXE-alpha (particle-induced x-ray emission) system developed in collaboration by the INFN/LANDIS (Catania, Italy), the CNR/IBAM (Catania, Italy) and the CEA/LIST (Saclay, France), and the portable XRD (x-ray diffraction) diffractometer recently upgraded at the INFN/LANDIS. It is shown that using a combination of the two techniques, quantitative analysis is possible in some cases. The results of its application to Roman fresco fragments obtained from different archaeological sites in Catania (Italy) are presented. These results make it possible to identify the quantitative presence of various pigments: coloured earths, ochre, hematite, goethite, cinnabar, and Egyptian blue have been identified and quantified. Copyright (C) 2008 John Wiley & Sons, Ltd.
机译:这项工作展示了使用由INFN / LANDIS(意大利卡塔尼亚,意大利),CNR / IBAM(卡塔尼亚,意大利)和CEA / LIST(法国萨克莱),以及便携式XRD(x射线衍射)衍射仪最近在INFN / LANDIS进行了升级。结果表明,结合使用这两种技术,在某些情况下可以进行定量分析。介绍了将其应用于从卡塔尼亚(意大利)不同考古现场获得的罗马壁画片段的结果。这些结果使得有可能鉴定出各种颜料的定量存在:已经鉴定并定量了有色土,石,赤铁矿,针铁矿,朱砂和埃及蓝。版权所有(C)2008 John Wiley&Sons,Ltd.

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