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IMPROVEMENTS THROUGH PULSE SHAPE ANALYSIS IN X-RAY SPECTROMETRY USING SI(LI) DETECTORS

机译:使用SI(LI)检测器的X射线光谱中脉冲形状分析的改进

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摘要

Peak pile-up and other pulse distortion effects in an Si(Li) detector for x-ray spectroscopy were studied using pulse shape analysis. The pile-up interval, tau, was reduced to about 100 ns by using a combination of selection criteria on leading edge, constant fraction and zero-crossing time signals as functions of pulse height on pulses from an Si(Li) detector used for x-ray detection. Distortions in charge collection, giving rise to tailing effects, were also studied. Such effects were observed and pulses were isolated, but no major reduction in the background could be achieved. The pile-up reduction technique was successfully applied to the analysis of geological specimens resulting in improved detection limits. [References: 23]
机译:使用脉冲形状分析研究了用于X射线光谱的Si(Li)检测器中的峰堆积和其他脉冲畸变效应。通过将前沿,恒定分数和过零时间信号的选择标准组合为用于x的Si(Li)检测器的脉冲的脉冲高度的函数,将堆积间隔tau减小至约100 ns射线检测。还研究了电荷收集的失真,这会引起拖尾效应。观察到了这种影响并分离了脉冲,但是不能实现背景的大幅度降低。堆积减少技术已成功应用于地质标本的分析,从而提高了检测限。 [参考:23]

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