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DESCRIPTION OF X-RAY BEAMS USING THE FLUORESCENCE YIELDS OF A SET OF THICK TARGETS

机译:使用一组厚目标的荧光量描述X射线束

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摘要

Quantitative methods in x-ray fluorescence analysis require a knowledge of the spectral distribution of the fluorescence-exciting beam. The use of XRF yield measurements of a set of thick pure element targets is proposed for the description of a fluorescence-exciting x-ray beam, without the need to obtain its spectral distribution. This new approach is derived theoretically and verified by comparing thin-target yields calculated from XRF yield measurements of thick pure element specimens with those obtained from a calculated spectral distribution. The difference between the two methods of obtaining the thin-target yields is within 9% relative error. [References: 8]
机译:X射线荧光分析中的定量方法需要了解荧光激发光束的光谱分布。建议使用一组厚的纯元素靶标的XRF产量测量来描述激发荧光的X射线束,而无需获得其光谱分布。这种新方法在理论上得到了推论,并通过比较从厚的纯元素样品的XRF产量测量结果计算出的薄目标产量与从计算的光谱分布获得的结果得出了比较。两种获得稀薄目标产量的方法之间的差异在9%的相对误差内。 [参考:8]

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