A New Method for Rough Surface Profile Simulation Based on Peak-Valley Mapping

摘要

Starting from random process theory and taking peaks and valleys as reconstruction carriers to replace surface height distribution and autocorrelation function (ACF), a new method for rough surface simulation is proposed based on the peak-valley mapping principle. The proposed method is used to simulate rough surfaces with different correlation lengths. The simulated roughness parameters and ACF are examined. Comparisons of simulation precision and simulation efficiency between the proposed method and fast Fourier transform (FFT) are provided. Finally, the applications of the method are discussed briefly.