Preparation and characterisation of nanostructured tin oxide (SnO_2) films by sol-gel spin coating technique

摘要

Highly transparent tin oxide thin films (SnO2) have been prepared using the sol-gel spin coating technique, optimising process parameters such as the solute concentration, spin rate and time of the turn table, film thickness (number of coatings) and heat treatment temperature. The X-ray diffraction (XRD) studies point to the polycrystalline structure of the developed films. The films deposited under optimum conditions are highly transparent in the visible region with a transmittance of 94 percent at 550 nm and have a resistivity of 3 X 10~(-3) OMEGA cm. The films have been obtained at a relatively low process temperature of 400 deg C.