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首页> 外文期刊>The journal of physics and chemistry of solids >Formation of hook-shaped and straight silica wires by a thermal vapor method
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Formation of hook-shaped and straight silica wires by a thermal vapor method

机译:通过热蒸汽法形成钩形和直形硅胶线

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Hook-shaped and straight silica wires have been successfully synthesized on silicon wafer through a simple thermal vapor method with or without assistance of Al, respectively. The hook-shaped silica wires have amorphous structures with nearly 100 μm long and about 4 μm in average diameters, while the straight silica wires are hundreds of micrometers long and approximately 50300 nm in diameters. The composition analysis revealed that larger Al/SiO _x islands can form on the silicon substrate with Al catalysts, whereas tiny silica clusters form without Al catalysts. They could act as the nucleation centers for the growth of silica wires with different shapes. The formation process of hook-shaped silica microwire results from a thermal gradient on the silicon substrate. The thermal gradient may be caused by the cold gas flowing during the process or other factors that lead to uneven temperature. On the contrary, straight growth of silica submicrowire is unacted on the thermal gradient factor due to the tiny silica clusters as nucleation centers. The present simple and low-cost process of producing hook-shaped and straight silica wires in bulk may lead to potential applications in catalysts, electrode materials, biosensing, etc.
机译:通过简单的热蒸气法,分别在有或没有铝的辅助下,已成功地在硅晶片上合成了钩形和直形硅胶线。钩形二氧化硅线具有非晶结构,其长约100μm,平均直径约4μm,而直二氧化硅线长数百微米,直径约50300nm。组成分析表明,使用Al催化剂可以在硅基底上形成较大的Al / SiO x岛,而没有Al催化剂则可以形成微小的二氧化硅簇。它们可以充当不同形状的硅胶线生长的成核中心。钩形二氧化硅微丝的形成过程是由硅基板上的热梯度引起的。热梯度可能是由过程中流动的冷气体或其他导致温度不均匀的因素引起的。相反,由于微小的二氧化硅簇作为成核中心,因此二氧化硅亚微丝的直线生长对热梯度因子没有作用。批量生产钩形和直形硅胶线的当前简单且低成本的方法可能导致在催化剂,电极材料,生物传感等方面的潜在应用。

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