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The magnetizations and the susceptibilities in ferroelectric films described by a transverse spin-1/2 Ising model

机译:横向自旋1/2伊辛模型描述的铁电薄膜的磁化和磁化率

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The critical temperature in ferroelectric films described by a transverse spin-1/2 Ising model is studied using the effective field theory along with a probability distribution technique. We discuss an L layer film of simple cubic symmetry with nearest-neighbour interactions in which the strengths of the interactions are different from the bulk values in the surface layers. We derive the phase diagram, the longitudinal and transverse magnetization profiles and also the longitudinal and transverse susceptibilities. In such films, the critical temperature can shift to either lower or higher temperature compared with the corresponding bulk value. The film longitudinal susceptibility diverges at the critical temperature T-C while the film transverse susceptibility presents a cusp at T-C. (c) 2005 Elsevier Ltd. All rights reserved.
机译:使用有效场论和概率分布技术研究了由横向自旋1/2伊辛模型描述的铁电薄膜的临界温度。我们讨论了具有最邻近相互作用的简单立方对称的L层膜,其中相互作用的强度不同于表面层中的体积值。我们推导了相图,纵向和横向磁化曲线以及纵向和横向磁化率。在这种薄膜中,与相应的体积值相比,临界温度可以转变为更低或更高的温度。薄膜的纵向磁化率在临界温度T-C处发散,而薄膜的横向磁化率在T-C处出现尖峰。 (c)2005 Elsevier Ltd.保留所有权利。

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