Developing Vibrational Infrared Near Field Spectroscopy to Characterize Polymer Structures on Surfaces: Identification and Reduction of topographic Coupling Artifacts

摘要

We report efforts to develop infrared near field microscopy for the characterization of polymer surfaces. The new near field microscope is adapted from an atomic force microscope with custom optics to create a high spatial resolution imaging platform. In addition, we report developments of analytical and finite difference approaches relating the rough sample/light interaction, the resultant near field optical signal, and the chemical structure of the sample. Simulations of the role of a topographic coupling artifact of the observed near field signal, and a method to over come that artifact are presented.