Mossbauer Spectroscopy Study of Amorphous TbFeCo Films for Perpendicular Magnetic Data Recording

摘要

Amorphous films of the Tb x Fe (100 – x – y ) Coy system with a hickness of ~200 nm were deposited byRF magnetron sputtering at various pressures of argon ( PAr) in the working chamber. It is established that the easy axis in Tb 29Fe61Co10films is oriented at an angle of 1 °±4°relative to the normal to the film surface,whereas in Tb26Fe 65Co9films this axis is parallel to the normal. The properties of the Tb26Fe65Co9films depositedatPAr= 5 mTorr meet the requirements to media for the perpendicular magnetic data recording.