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首页> 外文期刊>Progress in Solid State Chemistry >Electrochemical and coupled XPS studies on Langmuir–Blodgett mixed films of behenic acid and over-grafted platinum nanoparticles: Effect of the behenic acid removal
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Electrochemical and coupled XPS studies on Langmuir–Blodgett mixed films of behenic acid and over-grafted platinum nanoparticles: Effect of the behenic acid removal

机译:山Lang酸和过度接枝铂纳米粒子的Langmuir-Blodgett混合膜的电化学和XPS耦合研究:山be酸去除的影响

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摘要

We report on the behavior of Pt nanoparticles functionalized with 4-mercaptoaniline over-grafted with 2-thiophenecarbonyl chloride. Stable Langmuir–Blodgett (LB) mixed films were built up from these particles with behenic acid (BHA). Such ultra-thin films were transferred onto gold substrates, which allowed the study of their electrochemical response towards Fe[(CN)6]3? and their XPS chemical analysis before and after the BHA removal. After washing, XPS analysis showed that the signals corresponding to the metal core and the capping agent were almost unchanged. Moreover, the layers became more compact, as shown by the Pt/Au intensity ratio decrease, because of the apparent decrease of length escape of electrons coming from gold, evidencing the removal of the fatty acid in the LB film structure. After BHA removal, the resulting electrochemical activity slightly increased. This result, in agreement with XPS analysis, showed the structural rearrangement within the film that facilitated the percolation between the particle domains.
机译:我们报告了功能化与4-巯基苯胺过度嫁接2-噻吩羰基氯的Pt纳米粒子的行为。稳定的Langmuir-Blodgett(LB)混合薄膜是由这些颗粒与山B酸(BHA)制成的。这种超薄膜被转移到金的基底上,从而研究了它们对Fe [(CN)6]3α的电化学反应。以及去除BHA之前和之后的XPS化学分析。清洗后,XPS分析表明,对应于金属芯和封端剂的信号几乎未变。此外,如Pt / Au强度比降低所示,各层变得更致密,这是因为来自金的电子的长度逃逸明显减少,证明了LB膜结构中脂肪酸的去除。除去BHA后,所得的电化学活性略有增加。该结果与XPS分析一致,表明薄膜内的结构重排促进了颗粒域之间的渗透。

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