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The morphology and structure of PS-b-P4VP block copolymer films by solvent annealing: effect of the solvent parameter

机译:溶剂退火的PS-b-P4VP嵌段共聚物薄膜的形貌和结构:溶剂参数的影响

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摘要

Lamellae (symmetric) forming polystyrene-b-poly(4-vinylpyridine) (PS-b-P4VP) block copolymers (BCPs) were used to produce nanostructured thin films by solvent (toluene) casting (spin-coating) onto silicon substrates. As expected, strong micellization of PS-P4VP in toluene results in poorly ordered hexagonally structures films. Following deposition the films were solvent annealed in various solvents and mixtures thereof. A range of both morphologies including micelle and microphase separated structures were observed. It was found that nanostructures typical of films of regular thickness (across the substrate) and demonstrating microphase separation occurred only for relatively few solvents and mixtures. The data demonstrate that simple models of solvent annealing based on swelling of the polymer promoting higher polymer chain mobility are not appropriate and more careful rationalization is required to understand these data. Analysis suggests that regular phase separated films can only be achieved when the copolymer Hildebrand solubility parameter is very similar to the value of the solvent. It is suggested that the solvent anneal method used is best considered as a liquid phase technique rather than a vapor phase method. The results show that solvent annealing methods can be a very powerful means to control structure and in some circumstances dominate other factors such as surface chemistry and surface energies.
机译:形成薄片(对称)的聚苯乙烯-b-聚(4-乙烯基吡啶)(PS-b-P4VP)嵌段共聚物(BCP)用于通过溶剂(甲苯)浇铸(旋涂)在硅基板上生产纳米结构的薄膜。不出所料,PS-P4VP在甲苯中的强烈胶束化会导致六角形结构薄膜的排列不规则。沉积之后,将膜在各种溶剂及其混合物中进行溶剂退火。观察到包括胶束和微相分离结构在内的两种形态的范围。已经发现,仅在相对较少的溶剂和混合物中,规则厚度的薄膜(横跨整个基板)所具有的典型的纳米结构就表现出了微相分离。数据表明,基于聚合物溶胀促进更高的聚合物链迁移率的简单溶剂退火模型并不适用,需要更仔细的合理化才能理解这些数据。分析表明,只有当共聚物的Hildebrand溶解度参数与溶剂值非常相似时,才能获得规则的相分离膜。建议最好将溶剂退火法视为液相技术,而不是气相法。结果表明,溶剂退火方法可能是控制结构的一种非常有效的方法,并且在某些情况下会主宰其他因素,例如表面化学和表面能。

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