Estimation of combining ability effects for Karnal bunt resistance and yield related traits in a new set of bread wheat (Triticum aestivum L.) genotypes

摘要

Eleven Bread wheat lines including ten Karnal bunt resistance donors and one highly susceptible genotype (WH 542) were crossed in a half diallel fashion to develop 55 F_(1s). All the studied traits viz. Karnal bunt infection per cent, Karnal bunt score, days to heading, number of tillers per plant, spike length, awn length, number of spikelets per spike, compactness and number of grains per spike were found to be influenced by additive as well as dominant gene effects with predominance of additive type of gene action. The Karnal bunt resistant parents viz. ALDAN, CMH77.308, H567.71, HD29, HD30, HP1531 and W485 were found to be the good general combiners for the yield related traits. These resistant parents can be further utilized in breeding programmes aimed at development of Karnal bunt resistant varieties.