Identification of sorghum genotypes with resistance to the sugarcane aphid Melanaphis sacchari under natural and artificial infestation.

摘要

Sugarcane aphid, Melanaphis sacchari is an endemic pest of sorghum during postrainy season, and there is a need to develop cultivars with resistance to this pest. Evaluation of a diverse array of sorghum genotypes under natural and artificial infestation resulted in identification of seven lines (ICSB 215, ICSB 323, ICSB 724, ICSR 165, ICSV 12001, ICSV 12004 and IS 40615) with moderate levels of resistance to aphid damage. Under artificial infestation, 10 lines suffered <20% loss in grain yield as compared to 72.4% grain loss in the susceptible check, Swarna. The genotypes ICSR 165, ICSB 724, IS 40615, DSV 5 and ICSB 323 exhibited moderate levels of resistance to aphid damage (damage rating, DR <5.0) and also had high grain yield potential (>30 q/ha). In another experiment, ICSB 215, ICSB 695, ICSR 161, Line 61510, ICSV 12004, Parbhani Moti and IS 40618 exhibited high grain yield potential (>25 q/ha) and exhibited <50% variation in grain yield as compared to more than 80% in the susceptible check, in CK 60 B. The genotypes RSV 1211, RS 29, RSV 1338, EC 8-2, PU 10-1, IS 40617 and ICSB 695 though showed a susceptible reaction to aphid damage, but suffered relatively low loss in grain yield, suggesting that these lines have tolerance to aphid damage. Principal coordinate analysis suggested that the genotypes with aphid resistance are quite diverse and can be used to breed for aphid resistance and high grain yield potential and also in breeding for aphid resistance in sorghum with adaptation to the postrainy season.