The Statistical Response to the Point Defect in Thermally Activated Remagnetization of Magnetic Dot Array

摘要

The regular square-shaped 5 x 5 segment of magnetic dots is simulated in a cyclic magnetic field under the simultaneous thermal activation. The simulation based on stochastic Landau-Lifshitz-Gilbert equation uncovered remarkable differences between statistics of defect-free and defect-including geometries