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Exciton and trion dynamics in atomically thin MoSe2 and WSe2: Effect of localization

机译:原子薄的MoSe2和WSe2中的激子和Trion动力学:局域化的影响

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We present a detailed investigation of the exciton and trion dynamics in naturally doped MoSe2 and WSe2 single atomic layers as a function of temperature in the range 10-300 K under above band-gap laser excitation. By combining time-integrated and time-resolved photoluminescence (PL) spectroscopy, we show the importance of exciton and trion localization in both materials at low temperatures. We also reveal the transition to delocalized exciton complexes at higher temperatures where the exciton and trion thermal energy exceeds the typical localization energy. This is accompanied by strong changes in PL including suppression of the trion PL and decrease of the trion PL lifetime, as well as significant changes for neutral excitons in the temperature dependence of the PL intensity and the appearance of a pronounced slow PL decay component. In MoSe2 and WSe2 studied here, the temperatures where such strong changes occur are observed at around 100 and 200 K, respectively, in agreement with their inhomogeneous PL line width of 8 and 20 meV at T approximate to 10 K. The observed behavior is a result of a complex interplay between influences of the specific energy ordering of bright and dark excitons in MoSe2 and WSe2, sample doping, trion, and exciton localization and various temperature-dependent nonradiative processes.
机译:我们提出了在上述带隙激光激发下,自然掺杂的MoSe2和WSe2单原子层中的激子和三重子动力学随温度在10-300 K范围内变化的函数的详细研究。通过结合时间积分和时间分辨光致发光(PL)光谱,我们表明在低温下两种材料中激子和Trion局域化的重要性。我们还揭示了在更高温度下激子和三重子热能超过典型局域能时,向离域激子复合物的转变。这伴随着PL的强烈变化,包括抑制trion PL和降低trion PL寿命,以及中性激子在PL强度的温度依赖性和显着缓慢的PL衰减成分出现方面的显着变化。在这里研究的MoSe2和WSe2中,观察到发生这种强烈变化的温度分别在100 K和200 K附近,这与它们在T处的不均匀PL线宽度8和20 meV接近10 K一致。 MoSe2和WSe2中亮和暗激子的比能排序,样品的掺杂,tri和激子定位以及各种与温度相关的非辐射过程之间的复杂相互作用的结果。

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