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Journal of Advanced Microscopy Research

Journal of Advanced Microscopy Research

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中文名称：先进显微镜研究杂志

ISSN：2156-7573
出版周期：3 issues a year

发文量：234

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1.Microscopic, Thermal and Mechanical Characteristics of Pressureless Infiltrated SiCp/Al Composites Doped with Silicon

机译：硅掺杂无压渗透SiCp / Al复合材料的微观，热学和力学特性
- 作者：Xiao-Wu Nie;Ya-Yan Zhou
- 期刊名称：《Journal of Advanced Microscopy Research》 | 2010年第1期
- Pressureless Infiltration;
- Electron Microscopy;
- Thermal Properties;
- Mechanical Properties;
2.A Rapid Microwave Synthesis at Low Temperatures, Electron Microscopy and Raman Study of MoO_(3) and WO_(x) Nanostructures

机译：MoO_（3）和WO_（x）纳米结构的低温快速微波合成，电子显微镜和拉曼研究
- 作者：Francis Leonard Deepak;Andrew J. Steveson;C. Vargas-Hernandez;Miguel Jose Yacaman
- 期刊名称：《Journal of Advanced Microscopy Research》 | 2010年第1期
- MoO_(3);
- WO_(x);
- Microwave Synthesis;
- Nanoparticles;
- Nanobelts;
- Nanorods;
3.Kelvin Probe Force Microscopy Study of LaAlO_(3)/SrTiO_(3) Heterointerfaces

机译：LaAlO_（3）/ SrTiO_（3）异质界面的开尔文探针力显微镜研究
- 作者：Vladimir N. Popok;Alexey Kalabukhov;Robert Gunnarsson;Sergey Lemeshko;Tord Claeson;Dag Winkler
- 期刊名称：《Journal of Advanced Microscopy Research》 | 2010年第1期
- LaAlO_(3)/SrTiO_(3) Heterointerface;
- Kelvin Probe Force Microscopy;
4.Observation of Piezoelectric Response on Tungsten Doped Barium Zirconium Titanate Ceramics

机译：钨掺杂钛酸锆钛酸钡陶瓷的压电响应观察
- 作者：Francisco Moura;Alexandre Zirpoli Simoes;Maria Aparecida Zaghete;Jose Arana Varela;Elson Longo
- 期刊名称：《Journal of Advanced Microscopy Research》 | 2010年第1期
- Piezoelectricity;
- Ceramics;
- Dieletric Response;
- Mixed Oxide;
5.Study of the Electron Tunnelling in Single-Barrier Nanostructures Using the Conductive Atomic Force Microscopy

机译：用导电原子力显微镜研究单势垒纳米结构中的电子隧穿
- 作者：Jaroslaw Gutek;Adam Kosiorek;Ryszard Czajka;Kris Kempa;Michael Giersig
- 期刊名称：《Journal of Advanced Microscopy Research》 | 2010年第1期
- Conductive Atomic Force Microscopy;
- Nanosphere Lithography;
- Tunnelling Junctions;
- Tunnelling Current;
6.Annealing Effects on the Microstructure and Magnetoresistance of Magnetic Tunnel Junctions with MgO-Barrier

机译：退火对含MgO势垒的磁性隧道结的组织和磁阻的影响
- 作者：H. F. Tian;C. Ren;H. X. Yang;J. Q. Li;Xiaoyong Liu;W. F. Shen;G. Xiao
- 期刊名称：《Journal of Advanced Microscopy Research》 | 2010年第1期
- Magnetic Tunnel Junctions;
- MgO-Barrier;
- Annealing;
- Microstructure;
- Magnetoresistance;
7.Annealing Effects on the Microstructure and Magnetoresistance of Magnetic Tunnel Junctions with MgO-Barrier

机译：退火对含MgO势垒的磁性隧道结的组织和磁阻的影响
- 作者：H. F. Tian;C. Ren;H. X. Yang;J. Q. Li;Xiaoyong Liu;W. F. Shen;G. Xiao
- 期刊名称：《Journal of Advanced Microscopy Research》 | 2010年第1期
- Magnetic Tunnel Junctions;
- MgO-Barrier;
- Annealing;
- Microstructure;
- Magnetoresistance;
8.Observation of Piezoelectric Response on Tungsten Doped Barium Zirconium Titanate Ceramics

机译：钨掺杂钛酸锆钛酸钡陶瓷的压电响应观察
- 作者：Francisco Moura;Alexandre Zirpoli Simoes;Maria Aparecida Zaghete;Jose Arana Varela;Elson Longo
- 期刊名称：《Journal of Advanced Microscopy Research》 | 2010年第1期
- Piezoelectricity;
- Ceramics;
- Dieletric Response;
- Mixed Oxide;
9.Condenser Aperture Reduction Phase Contrast: A New Technique for Improved Imaging in Light Microscopy

机译：聚光镜孔径减小相衬：光学显微镜中改进成像的新技术
- 作者：Jorg Piper
- 期刊名称：《Journal of Advanced Microscopy Research》 | 2010年第1期
- Phase Contrast;
- Light Microscopy;
- Aperture;
- Focal Depth;
- Depth of Field;
- Image Quality;
10.Microscopic, Thermal and Mechanical Characteristics of Pressureless Infiltrated SiCp/Al Composites Doped with Silicon

机译：硅掺杂无压渗透SiCp / Al复合材料的微观，热学和力学特性
- 作者：Xiao-Wu Nie;Ya-Yan Zhou
- 期刊名称：《Journal of Advanced Microscopy Research》 | 2010年第1期
- Pressureless Infiltration;
- Electron Microscopy;
- Thermal Properties;
- Mechanical Properties;
11.SEM and TEM Characterization of Cellulose Fibers Functionalized with Inorganic Oxide Nanoparticles

机译：无机氧化物纳米粒子功能化纤维素纤维的SEM和TEM表征
- 作者：Nika Veronovski;Silvo Hribernik
- 期刊名称：《Journal of Advanced Microscopy Research》 | 2010年第1期
- TiO_(2);
- SiO_(2);
- Cellulose Fibers;
- Anti-Microbial Properties;
- Scanning Electron Microscopy;
- Transmission Electron Microscopy;
12.Scanning Electron Microscopy for Testing the Quality of Direct and Indirect Dental Restorations

机译：扫描电子显微镜测试直接和间接牙科修复的质量
- 作者：B. Iordache;E. Gatin;R. R. Ilici;C. Luculescu;L. Ciobanu;I. Patrascu
- 期刊名称：《Journal of Advanced Microscopy Research》 | 2010年第1期
- Electron Microscopy;
- SEM;
- Metal Alloy;
- Resin-Based Composites;
13.A Rapid Microwave Synthesis at Low Temperatures, Electron Microscopy and Raman Study of MoO_(3) and WO_(x) Nanostructures

机译：MoO_（3）和WO_（x）纳米结构的低温快速微波合成，电子显微镜和拉曼研究
- 作者：Francis Leonard Deepak;Andrew J. Steveson;C. Vargas-Hernandez;Miguel Jose Yacaman
- 期刊名称：《Journal of Advanced Microscopy Research》 | 2010年第1期
- MoO_(3);
- WO_(x);
- Microwave Synthesis;
- Nanoparticles;
- Nanobelts;
- Nanorods;
14.SEM and TEM Characterization of Cellulose Fibers Functionalized with Inorganic Oxide Nanoparticles

机译：无机氧化物纳米粒子功能化纤维素纤维的SEM和TEM表征
- 作者：Nika Veronovski;Silvo Hribernik
- 期刊名称：《Journal of Advanced Microscopy Research》 | 2010年第1期
- TiO_(2);
- SiO_(2);
- Cellulose Fibers;
- Anti-Microbial Properties;
- Scanning Electron Microscopy;
- Transmission Electron Microscopy;
15.Kelvin Probe Force Microscopy Study of LaAlO_(3)/SrTiO_(3) Heterointerfaces

机译：LaAlO_（3）/ SrTiO_（3）异质界面的开尔文探针力显微镜研究
- 作者：Vladimir N. Popok;Alexey Kalabukhov;Robert Gunnarsson;Sergey Lemeshko;Tord Claeson;Dag Winkler
- 期刊名称：《Journal of Advanced Microscopy Research》 | 2010年第1期
- LaAlO_(3)/SrTiO_(3) Heterointerface;
- Kelvin Probe Force Microscopy;
16.Scanning Electron Microscopy for Testing the Quality of Direct and Indirect Dental Restorations

机译：扫描电子显微镜测试直接和间接牙科修复的质量
- 作者：B. Iordache;E. Gatin;R. R. Ilici;C. Luculescu;L. Ciobanu;I. Patrascu
- 期刊名称：《Journal of Advanced Microscopy Research》 | 2010年第1期
- Electron Microscopy;
- SEM;
- Metal Alloy;
- Resin-Based Composites;
17.Synthesis and Microscopic Characterization of In_(2)O_(3)/SnO_(2) Hetero-Junction Beaded Nanowires

机译：In_（2）O_（3）/ SnO_（2）异质结串珠纳米线的合成及微观表征
- 作者：N. M. A. Hadia;S. V. Ryabtsev;S. B. Kushchev;S. A. Soldatenko;E. P. Domashevskaya
- 期刊名称：《Journal of Advanced Microscopy Research》 | 2010年第1期
- In_(2)O_(3)/SnO_(2) Nanostructures;
- Nanofabrication;
- Transmission Electron Microscopy;
18.Condenser Aperture Reduction Phase Contrast: A New Technique for Improved Imaging in Light Microscopy

机译：聚光镜孔径减小相衬：光学显微镜中改进成像的新技术
- 作者：Jorg Piper
- 期刊名称：《Journal of Advanced Microscopy Research》 | 2010年第1期
- Phase Contrast;
- Light Microscopy;
- Aperture;
- Focal Depth;
- Depth of Field;
- Image Quality;
19.Synthesis and Microscopic Characterization of In_(2)O_(3)/SnO_(2) Hetero-Junction Beaded Nanowires

机译：In_（2）O_（3）/ SnO_（2）异质结串珠纳米线的合成及微观表征
- 作者：N. M. A. Hadia;S. V. Ryabtsev;S. B. Kushchev;S. A. Soldatenko;E. P. Domashevskaya
- 期刊名称：《Journal of Advanced Microscopy Research》 | 2010年第1期
- In_(2)O_(3)/SnO_(2) Nanostructures;
- Nanofabrication;
- Transmission Electron Microscopy;
20.Study of the Electron Tunnelling in Single-Barrier Nanostructures Using the Conductive Atomic Force Microscopy

机译：用导电原子力显微镜研究单势垒纳米结构中的电子隧穿
- 作者：Jaroslaw Gutek;Adam Kosiorek;Ryszard Czajka;Kris Kempa;Michael Giersig
- 期刊名称：《Journal of Advanced Microscopy Research》 | 2010年第1期
- Conductive Atomic Force Microscopy;
- Nanosphere Lithography;
- Tunnelling Junctions;
- Tunnelling Current;

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