机译:emphasis emphasistype="italic"In Situ/emphasis Nanoscale In-Plane Deformation Studies of Ultrathin Polymeric Films During Tensile Deformation Using Atomic Force Microscopy and Digital Image Correlation Techniques
机译:Effects of High-formula formulatype="inline"tex$kappa$/tex/formula (HfOformula formulatype="inline"tex$_2$/tex/formula) Gate Dielectrics in Double-Gate and Cylindrical-Nanowire FETs Scaled to the Ultimate Technology Nodes