机译:Transmission electron microscopy study of zirconia-alumina nanolaminates grown by reactive sputter deposition. part I: zirconia nanocrystallite growth morphology
机译:The effect of geometrical misfit dislocation on formation of microstructure and photoluminescence of Wurtzite GaN/Al{sub}2O{sub}3 (0001) films grown by low pressure metal-organic chemical vapor deposition
机译:Effect of the annealing temperature on structural and piezoelectric properties of the sol-gel Pb(Zr{sub}0.56Ti{sub}0.44){sub}0.90(Mg{sub}1/3Nb{sub}2/3){sub}0.10O{sub}3 films
机译:Effects of substrate materials and annealing temperature on crystal structure and epitaxy of La{sub}0.7Sr{sub}0.3MnO{sub}3 films via dipping-pyrolysis process
机译:Simultaneous determination of reflectance spectra along with {ψ(E),Δ(E)} in multichannel ellipsometry: applications to instrument calibration and reduction of real time data