首页>外文会议>其他>32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy

32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy

召开年：
召开地：
出版时间：-

会议文集：-

会议论文

热门论文

全部论文

全选（0）

1.An Ultra-Thin Polycrystalline-Silicon Thin-Film Transistor with SiGe Raised Source/Drain

机译：具有SiGe升高的源极/漏极的超薄多晶硅薄膜晶体管
- 作者：Du-Zen Peng;Po-Sheng Shih;Hsiao-Wen Zan;Ta-Shun Liao;Chun-Yen Chang
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
2.An Improved Model for Electron Mobility Degradation by Remote Coulomb Scattering in Ultra-Thin Oxide MOSFETs

机译：超薄氧化物MOSFET远程库仑散射降解电子迁移率的改进模型
- 作者：David Esseni;Antonio Abramo
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
3.Antimony as Substitute for Arsenic to Eliminate Enhanced Diffusion Effects

机译：锑替代砷消除扩散效应
- 作者：H. Ruecker;B. Heinemann;R. Barth;D. Bolze;V. Melnik;R. Kurps;D. Krueger
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
4.Characteristics of HfO_2 pMOSFET with Ultrashallow Junction Prepared by Plasma Doping and Laser Annealing

机译：等离子体掺杂激光退火制备超浅结HfO_2 pMOSFET的特性
- 作者：Sungkweon Baek;Sungho Heo;Hyunsang Hwang
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
5.Highly Extendible Memory Cell Architecture for Reliable Data Retention Time for 0.10μm Technology Node and beyond

机译：高度可扩展的存储单元架构，可为0.10μm技术节点及更高的数据保持可靠的数据保留时间
- 作者：Jaegoo Lee;Changhyun Cho;Juyong Lee;Sooho Shin;Jinwoo Lee;Donghwa Kwak;Kyuhyun Lee;Byunghyug Roh;Taeyoung Chung;Kinam Kim
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
6.Bulk Wafer Defects Observable in Vision Chips

机译：视觉芯片中可观察到的大晶圆缺陷
- 作者：Annika Rantzer;Christer Svensson
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
7.High-performance Silicon-On-Glass VDMOS transistor for RF-power applications

机译：用于射频功率应用的高性能玻璃硅VDMOS晶体管
- 作者：N. Nenadovic;V. Cuoco;M.P. v.d. Heijden;L.K. Nanver;J.W. Slotboom;S.J.C.H. Theeuwen;H.F.F. Jos
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
8.High-speed A/D Converters for Telecom Applications

机译：电信应用的高速A / D转换器
- 作者：Rudy van de Plassche
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
9.Cost Effective Implementation of a 90 V RESURF P-type Drain Extended MOS in a 0.35 μm Based Smart Power Technology

机译：在基于0.35μm的智能电源技术中经济高效地实现90 V RESURF P型漏极扩展MOS
- 作者：B. Bakeroot;M. Vermandel;J. Doutreloigne;P. Moens;D. Bolognesi
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
10.Gate dielectrics for high performance and low power CMOS SoC applications

机译：用于高性能和低功耗CMOS SoC应用的栅极电介质
- 作者：F.N. Cubaynes;C.J.J. Dachs;C. Detcheverry;A. Zegers;V.C. Venezia;J. Schmitz;P.A. Stolk;M. Jurczak;K. Henson;R. Degraeve;A. Rothschild;T. Conard;J. Petry;M. Da Rold;M. Schaekers;G. Badenes;L. Date;D. Pique;H.N. Al-Shareef;R.W. Murto
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
11.Coulomb Blockade in Thin SOI Nanodevices

机译：薄SOI纳米器件中的库仑封锁
- 作者：D. Fraboulet;X. Jehl;D. Mariolle;C. Le Royer;G. Le Carval;P. Scheiblin;P. Rivallin;D. Deleruyelle;L. Mollard;M. E. Nier;A.Toffoli;G. Molas;B. De Salvo;S. Deleonibus;M. Sanquer
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
12.Extraction of Si-SiO_2 Interface Trap Densities in MOSFET's With Oxides Down to 1.3 nm Thick

机译：氧化物厚度低至1.3 nm的MOSFET中Si-SiO_2界面陷阱密度的提取
- 作者：D. Bauza
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
13.Experimental study of depletion mode Si/SiGe MOSFETs for Low-Temperature Operation

机译：用于低温工作的耗尽型Si / SiGe MOSFET的实验研究
- 作者：K. Fobelets;R.S. Ferguson;V. Gaspari;J.E. Velazquez;K. Michelakis;S. Despotopoulos;J. Zhang;C. Papavassilliou
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
14.Fast polymer integrated circuits based on a polyfluorene derivative

机译：基于聚芴衍生物的快速聚合物集成电路
- 作者：W. Fix;A. Ullmann;J. Ficker;H. Rost;W. Clemens;D. Brennan;D. Welsh;J. OBrien
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
15.Influence of Doping Profile and Halo Implantation on the Threshold Voltage Mismatch of a 0.13 μm CMOS Technology

机译：掺杂轮廓和光晕注入对0.13μmCMOS技术的阈值电压失配的影响
- 作者：J.A. Croon;E. Augendre;S. Decoutere;W. Sansen;H.E. Maes
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
16.Investigation of HFO_2 dielectric stacks deposited by ALD with a mercury probe

机译：用汞探针研究ALD沉积的HFO_2电介质堆叠
- 作者：X.Garros;C. Leroux;D. Blin;J.F. Damlencourt;A.M. Papon;G. Reimbold
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
17.Mechanisms of dopant redistribution and retention in Silicon following ultra-low energy Boron implantation and excimer laser annealing

机译：超低能硼注入和准分子激光退火后硅中掺杂物的重新分布和保留机理
- 作者：L. Mariucci;G. Fortunato;S. Whelan;V. Privitera G. Mannino
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
18.Metal Rings as Quantum Bits

机译：金属环作为量子位
- 作者：Christoph Kerner;Wim Magnus;Wim Schoenmaker
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
19.Microwave Noise Modeling of the 0.18 μm Gate Length Mosfets with a 60 GHz cut-off frequency

机译：截止频率为60 GHz的栅极长度为0.18μm的MOSFET的微波噪声建模
- 作者：P.Sakalas;A.Litwin;H.Zirath;M.Schroeter
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
20.Lateral Trench Gate Super-Junction SOI-LDMOSFETs with Low On-Resistance

机译：具有低导通电阻的横向沟槽栅极超结SOI-LDMOSFET
- 作者：Jong Mun Park;Robert Klima;Siegfried Selberherr
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
21.A method for extraction of power dissipating sources from interferometric thermal mapping measurements

机译：一种从干涉热图测量中提取功率耗散源的方法
- 作者：D. Pogany;M. Litzenberger;S. Bychikhin;E. Gornik;G. Groos;M. Stecher
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
22.A Low On-Resistance 700V Charge Balanced LDMOS with Intersected WELL Structure

机译：阱结构相交的低导通电阻700V电荷平衡LDMOS
- 作者：Min-Hwan Kim;Jong-Jib Kim;Young-Suk Choi;Chang-Ki Jeon;Sung-Lyong Kim;Hyun-Soon Kang;Chang-Sub Song
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
23.Exploring Methods for Adequate Simulation of Sub-100nm Devices

机译：低于100nm器件的充分仿真的探索方法
- 作者：Victor Moroz;Norbert Strecker;Martin Jaraiz
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
24.Noise Analysis for a SiGe HBT by Hydrodynamic Device Simulation

机译：SiGe HBT噪声的流体动力装置仿真
- 作者：C. Jungemann;B. Neinhues;B. Meinerzhagen
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
25.A Biosensor for Direct Detection of DNA Sequences Based on Capacitance Measurements

机译：基于电容测量的直接检测DNA序列的生物传感器
- 作者：C.Guiducci;C. Stagni;G. Zuccheri;A. Bogliolo;L. Benini;B. Samori;B. Ricco
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
26.On the Origin of the 1/f~(1.7) Noise in Deep Submicron Partially Depleted SOI Transistors

机译：深亚微米部分耗尽的SOI晶体管中1 / f〜（1.7）噪声的起源
- 作者：N. Lukyanchikova;M. Petrichuk;N. Garbar;E. Simoen;A. Mercha;H. van Meer;K. De Meyer;C. Claeys
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
27.Novel Small-Dimension poly-Si TFTs with Improved Driving Current and Suppressed Short Channel Effects

机译：具有改善的驱动电流和抑制的短沟道效应的新型小尺寸多晶硅TFT
- 作者：Hsiao-Wen Zan;Chun-Yen Chang
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
28.A Robust and Physically Based Compact SOI-LDMOS Model

机译：坚固且基于物理的紧凑型SOI-LDMOS模型
- 作者：A.C.T. Aarts;R. van Langevelde
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
29.Accurate Modelling of Thin-Film Resistor up to 40 GHz

机译：高达40 GHz的薄膜电阻器的精确建模
- 作者：Zhenwen Wang;M. Jamal Deen;Ali H. Rahal
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
30.Accurate modeling of Quantum-Dot based Multi Tunnel Junction Memory: Optimization and process dispersions analyses for DRAM applications

机译：基于量子点的多隧道结存储器的精确建模：针对DRAM应用的优化和工艺分散分析
- 作者：Cyrille LE ROYER;Gilles LE CARVAL;David FRABOULET;Marc SANQUER
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
31.Accurate Delay Metric for On-chip Resistive Interconnect

机译：片上电阻互连的精确延迟指标
- 作者：Mourad Oulmane;Nicholas C. Rumin
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
32.A New Test Structure for In-situ Measurements of Interface Recombination During Surface Treatments

机译：表面处理过程中界面复合原位测量的新测试结构
- 作者：S.Daliento;A.Sanseverino;P.Spirito;F.Roca
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
33.Quantum Computation and Proposal for Solid-state quantum Gates

机译：固态量子门的量子计算与建议
- 作者：A. Bertoni;S. Reggiani
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
34.Roadmap Differentiation and Emerging Trends in BCD Technology

机译：BCD技术的路线图差异化和新兴趋势
- 作者：Claudio Contiero;Antonio Andreini;Paola Galbiati
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
35.Process Integration of Crystalline Pr_2O_3 High-k Gate Dielectrics

机译：晶体Pr_2O_3高k栅极电介质的工艺集成
- 作者：U. Schwalke;K. Boye;K. Haberle;R. Heller;G. Hess;G. Mueller;T. Ruland;G. Tzschoeckel;J. Osten;A. Fissel;H.-J. Muessig
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
36.Pseudo Dynamic Gate Design based on the Resonant Tunneling-Bipolar Transistor (RTBT)

机译：基于谐振隧穿双极晶体管（RTBT）的伪动态门设计
- 作者：Peter Gloesekoetter;Christian Pacha;Karl F. Goser;Werner Prost;Samuel Kim;H. van Husen;T. Reimann;Franz J. Tegude
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
37.Physics of the subthreshold slope - initial improvement and final degradation in short CMOS devices

机译：亚阈值斜率的物理特性-短CMOS器件的初始改进和最终退化
- 作者：R. Gwoziecki;T. Skotnicki
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
38.Understanding nMOSFET characteristics after soft breakdown and their dependence on the breakdown location

机译：了解软击穿后的nMOSFET特性及其对击穿位置的依赖性
- 作者：B. Kaczer;R. Degraeve;A. De Keersgieter;G. Groeseneken;F. Crupi
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
39.Universal Test Structure and Characterization Method for Bias-Dependent Drift Series Resistance of HV MOSFETs

机译：高压MOSFET随偏置漂移串联电阻的通用测试结构和表征方法
- 作者：C. Anghel;N. Hefyene;A. Ionescu;S.F. Frere;R. Gillon;J. Rhayem
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
40.Thermal nitridation of chemical dielectrics as an easy approach to ultra-thin gate oxide processing

机译：化学电介质的热氮化是超薄栅极氧化物处理的简便方法
- 作者：M. Bidaud;J-P. Carrere;F. Guyader;M. Juhel;R. Pantel
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
41.Monolithic Integration of a Novel Microfluidic Device with Silicon Light Emitting Diode-Antifuse and Photodetector

机译：新型微流控器件与硅发光二极管-反熔丝和光电探测器的单片集成
- 作者：P. LeMinh;J. Holleman;J.W. Berenschot;N.R. Tas;A. van den Berg
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
42.Modeling the C-V Characteristics of Heterodimensional Schottky Contacts

机译：建模异质肖特基接触的C-V特性
- 作者：R. Ragi;J. Manzoli;M. A. Romero;B. Nabet
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
43.New Mechanism of Body Charging in Partially Depleted SOI-MOSFETs with Ultra-Thin Gate Oxides

机译：具有超薄栅极氧化物的部分耗尽SOI-MOSFET体充电的新机制
- 作者：J. Pretet;T. Matsumoto;T. Poiroux;S. Cristoloveanu;R. Gwoziecki;C. Raynaud;A. Roveda;H. Brut
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
44.Optimization of Single Halo p-MOSFET Implant Parameters for Improved Analog Performance and Reliability

机译：优化单个Halo p-MOSFET注入参数以提高模拟性能和可靠性
- 作者：Neeraj K. Jha;V. Ramgopal Rao;J.C.S.Woo
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
45.Three-Dimensional Analysis of a MAGFET at 300 K and 77 K

机译：MAGFET在300 K和77 K时的三维分析
- 作者：Rodrigo Rodriguez-Torres;Robert Klima;Siegfried Selberherr;Edmundo A. Gutierrez-D.
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
46.Investigation of performance improvement and gate-to-junction leakage reduction for the 90nm CMOS gate stack architeture

机译：90nm CMOS栅极叠层架构的性能改进和栅结泄漏减少的研究
- 作者：K.Henson;S.Kubicek;A.Redolfi;K.DeMeyer;M.Jurczak;E.Augendre
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
47.Study of Hot-Spot Phenomena in Cellular Power Transistors by Analytical Electro-Thermal Simulation

机译：解析电热模拟研究蜂窝功率晶体管中的热点现象
- 作者：Paolo Emilio Bagnoli;Stefano Di Pascoli;Giovanni Breglio
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
48.RPN Oxynitride Gate Dielectrics for 90 nm Low Power CMOS Applications

机译：用于90 nm低功耗CMOS应用的RPN氧氮化物栅极电介质
- 作者：A. Veloso;M. Jurczak;F. N. Cubaynes;R. Rooyackers;S. Mertens;A. Rothschild;M. Schaekers;H. N. Al-Shareef;R. W. Murto;C. J. J. Dachs;G. Badenes
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
49.The Art and Science of Integrated Systems Design

机译：集成系统设计的艺术与科学
- 作者：Luca P. Carloni;Fernando De Bernardinis;Alberto L. Sangiovanni-Vincentelli;Marco Sgroi
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
50.Suitability of Scaled SOI CMOS for High-frequency Analog Circuits

机译：标度SOI CMOS在高频模拟电路中的适用性
- 作者：N. Zamdmer;J.-O. Plouchart;J. Kim;L.-H. Lu;S. Narasimha;P. A. ONeil;A. Ray;M. Sherony;L. Wagner
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
51.Silicon Single-Electron Devices for Logic Applications

机译：逻辑应用的硅单电子器件
- 作者：Yasuo TAKAHASHI;Yukinori ONO;Akira FUJIWARA;Hiroshi INOKAWA
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
52.SiGe pMOSFETs Fabricated on Novel SiGe Virtual Substrates Grown on 10μm x10μm Pillars

机译：在10μmx10μm柱上生长的新型SiGe虚拟衬底上制造的SiGe pMOSFET
- 作者：U. N. Straube;A. M. Waite;N. S. Lloyd;S. G. Croucher;Y. T. Tang;A. G. R. Evans;T. J. Grasby;T. E. Whall;E. C. H. Parker;D. Norris;T. Cullis
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
53.Stability of High-k Thin Films in Moisture Ambience - The Effect of Dissolution Gas from Acryl Apparatus -

机译：高k薄膜在湿度环境中的稳定性-丙烯装置溶解气体的影响-
- 作者：Sadahiro Akama;Akira Kikuchi;Junichi Tonotani;Shun-ichiro Ohmi;Hiroshi Iwai
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
54.Spike anneal optimization for digital and analogue high performance 0.13 μm CMOS platform

机译：针对数字和模拟高性能0.13μmCMOS平台的峰值退火优化
- 作者：E.Josse;F.Arnaud;F.Wacquant;D.Lenoble;O.Menut;E.Robilliart
- 会议名称：《》 | 2002年
55.Source/Drain Parasitic Resistance Role and Electrical Coupling Effect in sub 50nm MOSFET Design

机译：50nm以下MOSFET设计中的源/漏寄生电阻作用和电耦合效应
- 作者：Jun Yuan;Peter M. Zeitzoff;Jason C. S. Woo
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
56.Simulation of high-K tunnel barriers for nonvolatile floating gate memories

机译：非易失性浮栅存储器的高K隧道势垒仿真
- 作者：Michael Specht;Martin Staedele;Franz Hofmann
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
57.Vertical high voltage devices on thick SOI with back-end trench formation

机译：具有后端沟槽形成的厚SOI上的垂直高压器件
- 作者：Ulrich Heinle;Kuntjoro Pinardi;Joergen Olsson
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
58.Voltage-controlled substrate structure for integrated inductors in standard digital CMOS technologies

机译：用于标准数字CMOS技术中集成电感器的压控衬底结构
- 作者：Judith Maget;Rainer Kraus;Marc Tiebout
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
59.The Four-Gate Transistor

机译：四门晶体管
- 作者：S. Cristoloveanu;B. Blalock;F. Allibert;B. Dufrene;M. Mojarradi
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
60.Triple Gate Oxide by nitrogen implantation integrated in a 0.13μm CMOS flow

机译：通过氮注入将三栅极氧化层集成在0.13μmCMOS流中
- 作者：J-P. Carrere;A. Grouillet;F. Guyader;A. Beverina;M. Bidaud;A.Halimaoui
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
61.UIS-Failure for DMOS Power Transistors

机译：UIS-DMOS功率晶体管故障
- 作者：A.Icaza Deckelmann;G.Wachutka;F. Hirler;J. Krumrey
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
62.Nanoscale System Design Challenges: Business as Usual?

机译：纳米系统设计挑战：照常营业吗？
- 作者：Hugo J. De Man
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
63.On the n~+-GaAs/p~+-InGaP~--GaAs High-Barrier Camel-Like Gate Transistor for High-Breakdown, Low-Leakage and High-Temperature Operations

机译：用于高击穿，低泄漏和高温操作的n〜+ -GaAs / p〜+ -InGaP / n〜-GaAs高势垒骆驼式栅极晶体管
- 作者：W. C. Liu;K. H. Yu;H. M. Chuang;K. W. Lin;K. M. Lee;S. F. Tsai
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
64.Impact of Tunnel Oxide Thickness on Erratic Erase in Flash Memories

机译：隧道氧化物厚度对闪存中易失性擦除的影响
- 作者：Andrea Chimenton;Piero Olivo
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
65.Impact of Deep N-well Implantation on Substrate Noise Coupling and RF Transistor Performance for Systems-on-a-Chip Integration

机译：深N阱注入对片上系统集成的基板噪声耦合和RF晶体管性能的影响
- 作者：K. W. Chew;J. Zhang;K. Shao;W. B. Loh;S-. F. Chu
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
66.Future Trends in Intelligent Interface Technologies for 42 V Battery Automotive Applications

机译：用于42 V电池汽车应用的智能接口技术的未来趋势
- 作者：P. Moens;D. Bolognesi;L. Delobel;D. Villanueva;K. Reynders;A. Lowe;G. Van Herzeele;M. Tack;B. Bakeroot
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
67.Imagine the Future in Communications Technology

机译：想象通信技术的未来
- 作者：D. Harame A.Joseph;D.Coolbaugh;G. Freeman;D.Greenberg;M.Ritter;K.Newton;S.M.Parker;R.Groves;H.Zamat;V.S.Marangos;M.M.Doherty;O. Schreiber;T.Tanji;D.A.Herman;M.Meghali;R.Singh
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
68.Design Sensitivity in Quasi-One-Dimensional Silicon-Based Photonic Crystalline Waveguides

机译：准一维硅基光子晶体波导的设计灵敏度
- 作者：Akira Shimizu;Yukio Iida;Yasuhisa Omura
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
69.Impact of source/drain implants on threshold voltage matching in deep sub-micron CMOS technologies

机译：深亚微米CMOS技术中源/漏注入对阈值电压匹配的影响
- 作者：Jerome Dubois;Johan Knol;Mike Bolt;Hans Tuinhout;Jurriaan Schmitz;Peter Stolk
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
70.Constant and Switched Bias Low Frequency Noise in p-MOSFETs with Varying Gate Oxide Thickness

机译：栅极氧化物厚度变化的p-MOSFET中的恒定和开关偏置低频噪声
- 作者：J.S. Kolhatkar;C. Salm;M.J. Knitel;H. Wallinga
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
71.Investigation of the Thermal Noise of MOS Transistors under Analog and RF Operating Conditions

机译：模拟和射频工作条件下MOS晶体管的热噪声研究
- 作者：Ralf Brederlow;Georg Wenig;Roland Thewes
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
72.Investigations on Poly-SiGe gate in full 0.1μm CMOS integration

机译：完全0.1μmCMOS集成中的多晶硅栅的研究
- 作者：Brice Tavel;Frederic Monsieur;Pascal Ribot;Thomas Skotnicki
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
73.Diffusion Suppression in Silicon by Substitutional C Doping

机译：取代碳掺杂在硅中的扩散抑制
- 作者：N.E.B. Cowern;B. Colombeau;F. Roozeboom;M. Hopstaken;H. Snijders;P. Meunier-Beillard;W. Lerch
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
74.Integrated Si-Based Opto-Couplers: a Novel Approach to Galvanic Isolation

机译：集成的基于硅的光电耦合器：一种新颖的电隔离方法
- 作者：Antonio Alessandria;Luigi La Magna;Marco Renna;Leonardo Fragapane;Salvatore Coffa
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
75.Identification of Critical Parameters for Plasma Process-Induced Damage in 130 and 100 nm CMOS Technologies

机译：确定130和100 nm CMOS技术中等离子工艺引起的损伤的关键参数
- 作者：Geert Van den bosch;Brice De Jaeger;Zsolt Toekei;Guido Groeseneken
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
76.Inversion Layer Quantization Impact on the Interpretation of 1/f Noise in Deep Submicron CMOS Transistors

机译：反转层量化对深亚微米CMOS晶体管1 / f噪声的解释影响
- 作者：A. Mercha;E. Simoen;G. Richardson;C. Claeys
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
77.Electrical Characterisation of Silicon-Rich-Oxide Based Memory Cells Using Pulsed Current-Voltage Techniques

机译：使用脉冲电流电压技术对富硅氧化硅存储单元进行电学表征
- 作者：M. Rosmeulen;E. Sleeckx;K. De Meyer
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
78.Electrical Characteristics of Gd_2O_3 thin film deposited on Si substrate

机译：硅衬底上沉积的Gd_2O_3薄膜的电学特性
- 作者：Chizuru Ohshima;Ikumi Kashiwagi;Shun-ichiro Ohmi;Hiroshi Iwai
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
79.Effect of Pulsed Stress on Leakage Current In MOS Capacitors For Non-Volatile Memory Applications

机译：脉冲应力对非易失性存储应用中MOS电容器漏电流的影响
- 作者：D. Caputo;R. Feruglio;F. Irrera;B. Ricco
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
80.Effects of random discrete impurities in ultra-short MOSFET using 3D Monte Carlo simulation

机译：使用3D蒙特卡洛模拟的超短MOSFET中随机离散杂质的影响
- 作者：Sylvain Barraud;Philippe Dollfus;Sylvie Galdin;Patrice Hesto
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
81.Evaluation of Interface Trap Density in a SiGe/Si Heterostructure Using a Charge Pumping Technique and Correlation between the Trap Density and Low Frequency Noise in SiGe-Channel pMOSFETs

机译：使用电荷泵技术评估SiGe / Si异质结构中的界面陷阱密度以及SiGe沟道pMOSFET的陷阱密度与低频噪声之间的相关性
- 作者：Toshiaki Tsuchiya;Yuji Imada;Junichi Murota
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
82.Extraction method for the impact-ionization multiplication factor in silicon at large operating temperatures

机译：大工作温度下硅中冲击电离倍增因子的提取方法
- 作者：E. Gnani;S. Reggiani;M. Rudan;G. Baccarani
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
83.Precision and Robust CMOS Voltage Reference Based on the Work Function Difference of Poly Si Gate

机译：基于多晶硅栅功函数差的精密鲁棒CMOS电压基准
- 作者：H. Watanabe;S. Ando;H. Aota;M. Dainin;Y. J. Chun;K. Taniguchi
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
84.Current Mirror Evaluation Logic: A New Circuit Style for High Fan-in Dynamic Gates

机译：电流镜评估逻辑：高扇入动态门的新电路风格
- 作者：Tamer Cakici;Kaushik Roy
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
85.A 900 MHz, 2.7 V Highly Linear Driver Amplifier Using 0.5 μm Si BiCMOS

机译：使用0.5μmSi BiCMOS的900 MHz，2.7 V高线性驱动器放大器
- 作者：Kwang Ho Ahn;Hyun Seok Kim;Dong Jin Kum;Byeong Ha Park
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
86.A Dynamic and Differential CMOS Logic with Signal Independent Power Consumption to Withstand Differential Power Analysis on Smart Cards

机译：动态和差分CMOS逻辑，具有独立于信号的功耗，可承受智能卡上的差分功率分析
- 作者：Kris Tiri;Moonmoon Akmal;Ingrid Verbauwhede
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
87.Driving the DSL highway : high speed, high density, low power, low cost

机译：驾驶DSL高速公路：高速，高密度，低功耗，低成本
- 作者：Jan Sevenhans;Wim De Wilde;Elve Moons;Peter Reusens;Laurent Berti;Lajos Kiss;Herman Casier;Georges Gielen
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
88.Modeling and Experimental Verification of Substrate Noise Generation in a 220Kgates WLAN System-on-Chip with Multiple Supplies

机译：具有多个电源的220Kgates WLAN片上系统中基板噪声产生的建模和实验验证
- 作者：Mustafa Badaroglu;Stéphane Donnay;Hugo De Man;Yann Zinzius;Georges Gielen;Tony Fonden;Svante Signell
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
89.Dynamic Hot Spot Temperature Sensing in Smart Power Switches

机译：智能电源开关中的动态热点温度感测
- 作者：Michael Glavanovics;Heinz Zitta
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
90.Multi-Pole Bandwidth Enhancement Technique for Trans-impedance Amplifiers

机译：跨阻放大器的多极带宽增强技术
- 作者：Behnam Analui;Ali Hajimiri
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
91.A 270 MHz, 1 V_(pk-pk), Low-Distortion Variable Gain Amplifier in 0.35 μm CMOS process

机译：0.35μmCMOS工艺中的270 MHz，1 V_（pk-pk），低失真可变增益放大器
- 作者：Siang Tong Tan;José Silva-Martínez
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
92.An Ultra-Low Power ADC for Distributed Sensor Networks

机译：用于分布式传感器网络的超低功耗ADC
- 作者：Michael D. Scott;Bernhard E. Boser;Kristofer S. J. Pister
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
93.A Multichannel, Pipeline Analog-to-Digital Converter for an Integrated 3-D Ultrasound Imaging System

机译：用于集成3D超声成像系统的多通道，管道模数转换器
- 作者：Kambiz Kaviani;?mer Oralkan;Butrus T. Khuri-Yakub;Bruce A. Wooley
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
94.Very Low Power High Temperature Stability Bandgap Reference Voltage

机译：超低功耗高温稳定性带隙基准电压
- 作者：W. Rahajandraibe;D. Auvergne;C. Dufaza;B. Cialdella;B. Majoux;V. Chowdhury
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
95.A Class AB CMOS Operational Amplifier for Application as Rail-to-Rail High Current Drive Output Buffer

机译：AB类CMOS运算放大器，用作轨到轨大电流驱动输出缓冲器
- 作者：P. Bruschi;D. Navarrini;M. Piotto
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
96.A 24GHz CMOS Front-end

机译：24GHz CMOS前端
- 作者：Xiang Guan;Ali Hajimiri
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
97.28 GHz Active I/Q Mixer with Integrated QVCO in SiGe Bipolar Technology

机译：采用SiGe双极技术的集成QVCO的28 GHz有源I / Q混频器
- 作者：Sabine Hackl;Josef B(o)ck;G(u)nter Ritzberger
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
98.Transceiver Front-End with Integrated TX/RX Commutator for Bluetooth Applications

机译：带有集成TX / RX换向器的收发器前端，用于蓝牙应用
- 作者：Vincent Knopik;Didier Belot;Danilo Gerna
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
99.A High-Speed Monolithic Amplifier for CRT Drivers in SOI

机译：SOI中用于CRT驱动器的高速单片放大器
- 作者：Alok Govil;Remus Albu;Ted Letavic;John Petruzzello;Mark Simpson;Satyen Mukherjee
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年
100.A CMOS Adaptive Interference Reduction System for Nerve Cuff Recordings

机译：用于神经袖套记录的CMOS自适应干扰减少系统
- 作者：Iasonas F. Triantis;Robert Rieger;John Taylor;Andreas Demosthenous;Nick Donaldson
- 会议名称：《32nd European Solid-State Device Research Conference (ESSDERC 2002), Sep 24-26, 2002, Firenze, Italy》 | 2002年