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IEEE Instrumentation & Measurement Technology Conference;I2MTC 2010

召开年：2010
召开地：Austin, TX(US);Austin, TX(US)
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1.Maximum likelihood estimation of ADC Parameters

机译：ADC参数的最大似然估计
- 作者：Balogh, Laszlo; Kollar, Istvan; Sarhegyi, Attila
- 会议名称：《IEEE Instrumentation & Measurement Technology Conference;I2MTC 2010》 | 2010年
2.A new sensing method for Electrical Capacitance Tomography

机译：电容层析成像的新传感方法
- 作者：Fan, Zhaoyan; Gao, Robert X.
- 会议名称：《IEEE Instrumentation & Measurement Technology Conference;I2MTC 2010》 | 2010年
- Electrical capacitance tomography;
- remote sensing;
- system monitoring;
3.Cross correlation velocity of oil-water two-phase flow by a Dual-plane Electrical Resistance Tomography system

机译：双平面电阻层析成像系统的油水两相流互相关速度
- 作者：Tan, Chao; Dong, Feng
- 会议名称：《IEEE Instrumentation & Measurement Technology Conference;I2MTC 2010》 | 2010年
- cross-correlation;
- electrical resistance tomography;
- horizontal pipe;
- oil-water two-phase flow;
4.The INL verification puzzle

机译：INL验证难题
- 作者：Leip, David; Lia, Dennis; Max, Solomon
- 会议名称：《IEEE Instrumentation & Measurement Technology Conference;I2MTC 2010》 | 2010年
- ATE;
- Accuracy;
- DAC;
- DNL;
- INL;
- Linearity;
- Measurement;
5.The design of a FPGA-based digital magnetic induction tomography (MIT) system for metallic object imaging

机译：基于FPGA的金属物体成像数字磁感应层析成像（MIT）系统的设计
- 作者：Yin, Wuliang; Chen, Guang; Jiang, Jian; Cui, Ziqiang
- 会议名称：《IEEE Instrumentation & Measurement Technology Conference;I2MTC 2010》 | 2010年
- Digital System;
- Imaging;
- MIT;
- Metallic Objects;
6.Performance evaluation and optimization of UHF RFID systems

机译：UHF RFID系统的性能评估和优化
- 作者：Bertocco, Matteo; Chiara, Andrea Dalla; Sona, Alessandro
- 会议名称：《IEEE Instrumentation & Measurement Technology Conference;I2MTC 2010》 | 2010年
7.Microwave resonant switched-slot probe with perpendicular coaxial feed

机译：垂直同轴馈电的微波谐振开关缝探头
- 作者：Kharkovsky, S.; Kam, K.; Ghasr, M.T.; McClanahan, A.D.; Abou-Khousa, M.A.; Zoughi, R.; Perez, I.
- 会议名称：《IEEE Instrumentation & Measurement Technology Conference;I2MTC 2010》 | 2010年
- PIN diode;
- imaging;
- microwave;
- perpendicular coaxial feed;
- resonant slot;
- sensing;
8.Master-slave dual readers enhanced aloha anti-collision mechanism for dense active RFID

机译：主从双读卡器增强了密集活动RFID的防撞机制
- 作者：Sun, Qunying; Zhang, Hongjian; Mo, Lingfei
- 会议名称：《IEEE Instrumentation & Measurement Technology Conference;I2MTC 2010》 | 2010年
- ALOHA;
- active RFID;
- anti-collision;
- master-slave;
9.New procedure for estimation of amplitude and phase of complex ac signals

机译：估计复杂交流信号幅度和相位的新程序
- 作者：Petrovic, Predrag B.
- 会议名称：《IEEE Instrumentation & Measurement Technology Conference;I2MTC 2010》 | 2010年
- Band-limited signals;
- Fourier coefficient estimation;
- analytical solutions;
- signal reconstruction;
- time domain;
10.Performance verification of instruments adopted for voltage dip measurement

机译：用于电压跌落测量的仪器的性能验证
- 作者：Gallo, Daniele; Landi, Carmine; Luiso, Mario
- 会议名称：《IEEE Instrumentation & Measurement Technology Conference;I2MTC 2010》 | 2010年
- Measurement Accuracy;
- Power Quality instrument;
- Sag;
- Voltage Dip;
- performance characterization;
11.Acoustic imaging system using the CAPTAN architecture

机译：使用CAPTAN架构的声学成像系统
- 作者：Turqueti, Marcos; Saniie, Jafar; Oruklu, Erdal
- 会议名称：《IEEE Instrumentation & Measurement Technology Conference;I2MTC 2010》 | 2010年
- Acoustic arrays;
- MEMS;
- real-time;
- scalable;
- sound imaging;
- sound tracking;
12.A BE-SOI MEMS for inertial measurement in geophysical applications

机译：用于地球物理应用中惯性测量的BE-SOI MEMS
- 作者：Ando, B.; Baglio, S.; Marletta, V.; Savalli, N.; Trigona, C.; Carbone, D.; Patane, D.; Rapisarda, S.; Zuccarello, L.
- 会议名称：《IEEE Instrumentation & Measurement Technology Conference;I2MTC 2010》 | 2010年
- BE-SOI;
- MEMS;
- inertial sensor;
- low-cost;
- volcanic monitoring;
13.A design of near infrared spectrometer for pears sugar concentration analysis

机译：梨糖浓度分析的近红外光谱仪设计
- 作者：Chen, Chien-Hung; Chen, Chih-Wen; Liao, Tai-Shan; Hwang, Chi-Hung
- 会议名称：《IEEE Instrumentation & Measurement Technology Conference;I2MTC 2010》 | 2010年
- Near infrared;
- PLSR (partial least square regression);
- Sugar concentration;
- flat-field concave grating;