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IEEE Latin-American Test Symposium

召开年：2020
召开地：Maceio(BR)
出版时间：-

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1.Welcome Message

机译：欢迎留言
- 会议名称：《IEEE Latin-American Test Symposium》 | 2020年
2.Circuit Level Design Methods to Mitigate Soft Errors

机译：缓解软错误的电路级设计方法
- 作者：Ricardo Reis;Cristina Meinhardt;Alexandra L. Zimpeck;Leonardo H. Brendler;Leonardo Moraes
- 会议名称：《IEEE Latin-American Test Symposium》 | 2020年
- Transistors;
- Logic gates;
- Robustness;
- Switching circuits;
- Layout;
- Topology;
- Adders;
3.A Highly Reliable Wearable Device for Fall Detection

机译：用于跌倒检测的高度可靠的可穿戴设备
- 作者：João Carlos Britto Filho;Marcelo Lubaszewski
- 会议名称：《IEEE Latin-American Test Symposium》 | 2020年
- Microprocessors;
- Sensors;
- Batteries;
- Circuit faults;
- Fault tolerance;
- Fault tolerant systems;
4.A Test Architecture and VIE to Characterize Dielectric Absorption in Small Capacitors

机译：测试架构和VIE表征小型电容器中的介电吸收
- 作者：Carlos Bernal;Manuel Jimenez;Chris Aquino;Raul Cedres
- 会议名称：《IEEE Latin-American Test Symposium》 | 2020年
- Capacitors;
- Absorption;
- Control systems;
- Oscilloscopes;
- Graphical user interfaces;
5.At Speed Testing Challenges and Solutions for 56Gbps and 112Gbps PAM4 SerDes

机译：针对56Gbps和112Gbps PAM4 SerDes的实时测试挑战和解决方案
- 作者：Salem Abdennadher;Kyle Tripician;Senthil Singaravelu
- 会议名称：《IEEE Latin-American Test Symposium》 | 2020年
- Receivers;
- Transmitters;
- Optical signal processing;
- Built-in self-test;
- Loss measurement;
- Insertion loss;
6.Optimizing RISC-V ISA Usage by Sharing Coprocessors on MPSoC

机译：通过共享MPSoC上的协处理器来优化RISC-V ISA使用
- 作者：Pedro Lima;Caio Vieira;Jorge Reis;Alexandre Almeida;Jarbas Silveira;Roger Goerl;César Marcon
- 会议名称：《IEEE Latin-American Test Symposium》 | 2020年
- Computer architecture;
- Coprocessors;
- Power dissipation;
- Hardware;
- Measurement;
- Instruction sets;
- Micromechanical devices;
7.Soft error reliability predictor based on a Deep Feedforward Neural Network

机译：基于深度前馈神经网络的软错误可靠性预测器
- 作者：David Ruiz Falcó;Alejandro Serrano-Cases;Antonio Martinez-Alvarez;Sergio Cuenca-Asensi
- 会议名称：《IEEE Latin-American Test Symposium》 | 2020年
- Optimization;
- Reliability;
- Circuit faults;
- Registers;
- Training;
- Predictive models;
- Benchmark testing;
8.Wafer-Level Die Re-Test Success Prediction Using Machine Learning

机译：使用机器学习的晶圆级芯片重测成功预测
- 作者：Hardi Selg;Maksim Jenihhin;Peeter Ellervee
- 会议名称：《IEEE Latin-American Test Symposium》 | 2020年
- Artificial neural networks;
- Training;
- Machine learning;
- Manufacturing;
- Feature extraction;
- Optimization;
9.MMS: A Software for Error Monitoring in Memories Protected by ECC

机译：MMS：一种用于在受ECC保护的内存中进行错误监视的软件
- 作者：M. F Domingos;G. H. Castro;J. Silveira;F. Silva;M. K. D Pereira;P. Lima
- 会议名称：《IEEE Latin-American Test Symposium》 | 2020年
- Software;
- Error correction codes;
- Random access memory;
- Microcontrollers;
- Reliability;
- Monitoring;
- Tools;
10.Mutation Operators for Concurrent Programs in Elixir

机译：Elixir中并发程序的变异算子
- 作者：Matheus Deon Bordignon;Rodolfo Adamshuk Silva
- 会议名称：《IEEE Latin-American Test Symposium》 | 2020年
- Task analysis;
- Programming;
- Concurrent computing;
- Testing;
- Synchronization;
- Kernel;
- Taxonomy;
11.An Experimental Comparison of Fault Injection Tools for Microprocessor-based Systems

机译：基于微处理器的系统的故障注入工具的实验比较
- 作者：Alexander Aponte-Moreno;José Isaza-González;Alejandro Serrano-Cases;Antonio Martínez-Álvarez;Sergio Cuenca-Asensi;Felipe Restrepo-Calle
- 会议名称：《IEEE Latin-American Test Symposium》 | 2020年
- Tools;
- Registers;
- Circuit faults;
- Hardware;
- Emulation;
- Reliability;
- Microcontrollers;
12.Run-time Hardware Reconfiguration of Functional Units to Support Mixed-Critical Applications

机译：功能单元的运行时硬件重新配置以支持关键混合应用
- 作者：Raphael Segabinazzi Ferreira;Jörg Nolte;Fabian Vargas;Nevin George;Michael Hübner
- 会议名称：《IEEE Latin-American Test Symposium》 | 2020年
- Fault detection;
- Program processors;
- Monitoring;
- Registers;
- Redundancy;
- Operating systems;
- Context;
13.Development and evaluation of a flexible instrumentation layer for system-level testing of radiation effects

机译：开发和评估用于系统级辐射效应测试的灵活仪器层
- 作者：Israel C. Lopes;Vincent Pouget;Frederic Wrobel;Frederic Saigne;Antoine Touboul;Ketil Røed
- 会议名称：《IEEE Latin-American Test Symposium》 | 2020年
- Instruments;
- Observability;
- Finite impulse response filters;
- Pulse width modulation;
- Reliability;
- Testing;
- Software;
14.Evaluating Software-based Hardening Techniques for General-Purpose Registers on a GPGPU

机译：评估GPGPU上通用寄存器的基于软件的强化技术
- 作者：Marcio M. Goncalves;Jose Rodrigo Azambuja;Josie E. R. Condia;Matteo Sonza Reorda;Luca Sterpone
- 会议名称：《IEEE Latin-American Test Symposium》 | 2020年
- Registers;
- Optimization;
- Fault tolerance;
- Fault tolerant systems;
- Instruction sets;
- Graphics processing units;
15.Analysis and detection of hard-to-detect full open defects in FinFET based SRAM cells

机译：基于FinFET的SRAM单元中难以检测到的全开缺陷的分析和检测
- 作者：Z. Perez;Javier Mesalles;H. Villacorta;Fabian Vargas;Victor Champac
- 会议名称：《IEEE Latin-American Test Symposium》 | 2020年
- FinFETs;
- SRAM cells;
- Circuit faults;
- Logic gates;
- Inverters;
- Semiconductor device modeling;
16.Testing Heatsink Faults in Power Transistors by means of Thermal Model

机译：通过热模型测试功率晶体管中的散热器故障
- 作者：Davide Piumatti;Matteo Vincenzo Quitadamo;Matteo Sonza Reorda;Franco Fiori
- 会议名称：《IEEE Latin-American Test Symposium》 | 2020年
- Heating systems;
- Mathematical model;
- Thermal resistance;
- Temperature measurement;
- Voltage measurement;
- Integrated circuit modeling;
17.Parametric faults detection and concealment on imager with FPGA implementation

机译：使用FPGA实现的成像仪参数故障检测和隐藏
- 作者：Ghislain Takam Tchendjou;Emmanuel Simeu
- 会议名称：《IEEE Latin-American Test Symposium》 | 2020年
- Image sensors;
- Circuit faults;
- PSNR;
- Dispersion;
- Correlation;
- Measurement;
- Image quality;
18.Soft Error Reliability of SRAM cells during the three operation states

机译：三种操作状态下SRAM单元的软错误可靠性
- 作者：Cleiton M. Marques;Cristina Meinhardt;Paulo F. Butzen
- 会议名称：《IEEE Latin-American Test Symposium》 | 2020年
- Computer architecture;
- Microprocessors;
- SRAM cells;
- Robustness;
- Circuit faults;
- Transistors;
19.Evaluating the Code Encryption Effects on Memory Fault Resilience

机译：评估代码加密对内存故障弹性的影响
- 作者：Riccardo Cantoro;Nikolaos I. Deligiannis;Matteo Sonza Reorda;Marcello Traiola;Emanuele Valea
- 会议名称：《IEEE Latin-American Test Symposium》 | 2020年
- Ciphers;
- Encryption;
- Nonvolatile memory;
- Receivers;
- Embedded systems;
- Circuit faults;
20.Resistance of the Montgomery kP Algorithm against Simple SCA: Theory and Practice

机译：蒙哥马利kP算法对简单SCA的抵抗力：理论和实践
- 作者：Ievgen Kabin;Zoya Dyka;Marcin Aftowicz;Dan Klann;Peter Langendoerfer
- 会议名称：《IEEE Latin-American Test Symposium》 | 2020年
- Clocks;
- Registers;
- Elliptic curves;
- Resistance;
- Galois fields;
- Electromagnetics;
- Elliptic curve cryptography;
21.Work-Function Fluctuation Impact on the SET Response of FinFET-based Majority Voters

机译：功函数波动对基于FinFET的多数选民的SET响应的影响
- 作者：Leonardo H. Brendler;Alexandra L. Zimpeck;Cristina Meinhardt;Ricardo Reis
- 会议名称：《IEEE Latin-American Test Symposium》 | 2020年
- Circuit faults;
- Delays;
- Logic gates;
- Metals;
- Robustness;
- FinFETs;
22.Towards Vehicle-Level Simulator Aided Failure Mode, Effect, and Diagnostic Analysis of Automotive Power Electronics Items

机译：面向汽车级模拟器的汽车电力电子项目的故障模式，影响和诊断分析
- 作者：J. Sini;M. DAuria;M. Violante
- 会议名称：《IEEE Latin-American Test Symposium》 | 2020年
- Two dimensional displays;
23.Implementing indirect test of RF circuits without compromising test quality: a practical case study

机译：在不影响测试质量的情况下实施射频电路的间接测试：一个实际案例研究
- 作者：H. El Badawi;F. Azais;S. Bernard;M. Comte;V. Kerzérho;F. Lefevre;I. Gorenflot
- 会议名称：《IEEE Latin-American Test Symposium》 | 2020年
- 1/f noise;
24.Influence of sampling frequency on TID response of SAR ADCs

机译：采样频率对SAR ADC TID响应的影响
- 作者：Bruno L. Costa;Carlos J. González;Rafael G. Vaz;Odair L. Gonçalez;Tiago R. Balen
- 会议名称：《IEEE Latin-American Test Symposium》 | 2020年
- Capacitors;
- Degradation;
- Radiation effects;
- Frequency conversion;
- Transistors;
- Failure analysis;
- Switches;
25.Evaluating the Impact of Ionizing Particles on FinFET -based SRAMs with Weak Resistive Defects

机译：评估电离粒子对具有弱电阻缺陷的基于FinFET的SRAM的影响
- 作者：Thiago Copetti;Guilherme Cardoso Medeiros;Mottaqiallah Taouil;Said Hamdioui;Letícia Bolzani Poehls;Tiago Balen
- 会议名称：《IEEE Latin-American Test Symposium》 | 2020年
- FinFETs;
- SRAM cells;
- Computational modeling;
- Reliability;
- SPICE;
- Transient analysis;