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IEEE European Test Symposium

召开年：2018
召开地：Bremen(DE)
出版时间：-

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1.A software reconfigurable assertion checking unit for run-time error detection

机译：用于运行时错误检测的软件可重新配置断言检查单元
- 作者：Yumin Zhou;Sebastian Burg;Oliver Bringmann;Wolfgang Rosenstiel
- 会议名称：《IEEE European Test Symposium》 | 2018年
- Hardware;
- Automata;
- Software;
- Circuit faults;
- Clocks;
- Real-time systems;
- Complex systems;
2.Locking of biochemical assays for digital microfluidic biochips

机译：锁定数字微流控生物芯片的生化分析
- 作者：Sukanta Bhattacharjee;Jack Tang;Mohamed Ibrahim;Krishnendu Chakrabarty;Ramesh Karri
- 会议名称：《IEEE European Test Symposium》 | 2018年
- Sequential analysis;
- Foundries;
- Electrodes;
- Hardware;
- Security;
- Fabrication;
3.ADC test methods using an impure stimulus: A survey

机译：使用不纯激励的ADC测试方法：一项调查
- 作者：Jan Schat
- 会议名称：《IEEE European Test Symposium》 | 2018年
- Built-in self-test;
- Sensitivity;
- Histograms;
- Standards;
- Maximum likelihood detection;
- Nonlinear filters;
- Production;
4.Challenges in Cell-Aware Test

机译：细胞感知测试的挑战
- 作者：Shreyas Pramod Dixit;Divyeshkumar Dhanjibhai Vora;Ke Peng
- 会议名称：《IEEE European Test Symposium》 | 2018年
- Libraries;
- Transistors;
- Logic gates;
- Cats;
- MOS devices;
- Circuit faults;
- Automatic test pattern generation;
5.Automatic generation of in-circuit tests for board assembly defects

机译：自动生成电路板组装缺陷在线测试
- 作者：Harm van Schaaijk;Martien Spierings;Erik Jan Marinissen
- 会议名称：《IEEE European Test Symposium》 | 2018年
- Probes;
- Periodic structures;
- Libraries;
- Compounds;
- Testing;
- Voltage measurement;
- Impedance;
6.Modeling and testing comparison faults of memristive ternary content addressable memories

机译：忆阻三元内容可寻址存储器的比较故障建模和测试
- 作者：Li-Wei Deng;Jin-Fu Li;Yong-Xiao Chen
- 会议名称：《IEEE European Test Symposium》 | 2018年
- Bridge circuits;
- Memristors;
- Circuit faults;
- Random access memory;
- Testing;
- Resistance;
- Transistors;
7.Covering hard-to-detect defects by thermal quorum sensing

机译：通过热定额感应覆盖难以检测的缺陷
- 作者：Po-Yao Chuang;Cheng-Wen Wu;Harry H. Chen
- 会议名称：《IEEE European Test Symposium》 | 2018年
- Sensors;
- Symbiosis;
- Circuit faults;
- Sociology;
- Statistics;
- Testing;
- Microorganisms;
8.Covering undetected transition fault sites with optimistic unspecified transition faults under multicycle tests

机译：在多周期测试中用乐观的未指定过渡故障覆盖未检测到的过渡故障站点
- 作者：Irith Pomeranz
- 会议名称：《IEEE European Test Symposium》 | 2018年
- Circuit faults;
- Clocks;
- Standards;
- Compaction;
- Delays;
- Computational modeling;
- Test pattern generators;
9.Methodology for determining the influencing factors of lifetime variation for power devices

机译：确定功率设备寿命变化影响因素的方法
- 作者：Ciprian V. Pop;Andi Buzo;Georg Pelz;Horia Cucu;Corneliu Burileanu
- 会议名称：《IEEE European Test Symposium》 | 2018年
- Correlation;
- Sensitivity analysis;
- Estimation;
- Robustness;
- Standards;
- Performance evaluation;
- Stress measurement;
10.On the mitigation of single event transients on flash-based FPGAs

机译：基于闪存的FPGA上的单事件瞬态缓解
- 作者：Sarah Azimi;Boyang Du;Luca Sterpone
- 会议名称：《IEEE European Test Symposium》 | 2018年
- Field programmable gate arrays;
- Convergence;
- Tools;
- Single event transients;
- Logic gates;
- Circuit faults;
- Sensitivity;
11.Assisted test design for non-intrusive machine learning indirect test of millimeter-wave circuits

机译：毫米波电路非介入式机器学习间接测试的辅助测试设计
- 作者：Florent Cilici;Manuel J. Barragan;Salvador Mir;Estelle Lauga-Larroze;Sylvain Bourdel
- 会议名称：《IEEE European Test Symposium》 | 2018年
- Sensors;
- Machine learning;
- Correlation;
- Machine learning algorithms;
- Feature extraction;
- Space exploration;
- Computational modeling;
12.Fault-detection-strengthened method to enable the POST for very-large automotive MCU in compliance with ISO26262

机译：增强故障检测的方法，可为超大型汽车MCU启用POST，符合ISO26262
- 作者：Senling Wang;Yoshinobu Higami;Hiroshi Takahashi;Hiroyuki Iwata;Yoichi Maeda;Jun Matsushima
- 会议名称：《IEEE European Test Symposium》 | 2018年
- Circuit faults;
- Automotive engineering;
- Tools;
- Discrete Fourier transforms;
- Logic gates;
- Hardware;
- Computer aided software engineering;
13.On no-reference on-line error-tolerability testing for videos

机译：视频的无参考在线容错测试
- 作者：Tong-Yu Hsieh;Shang-En Chan;Chi-Hsuan Ho
- 会议名称：《IEEE European Test Symposium》 | 2018年
- Videos;
- Benchmark testing;
- Decoding;
- Image quality;
- Quality assessment;
14.Recycled IC detection through aging sensor

机译：通过老化传感器进行回收的IC检测
- 作者：Daniele Rossi;Vasileios Tenentes;Saqib Khursheed;Sudhakar M. Reddy
- 会议名称：《IEEE European Test Symposium》 | 2018年
- Integrated circuits;
- Aging;
- Discharges (electric);
- Delays;
- Degradation;
- Partial discharges;
15.Detection of IJTAG attacks using LDPC-based feature reduction and machine learning

机译：使用基于LDPC的特征约简和机器学习来检测IJTAG攻击
- 作者：Xuanle Ren;R. D. Shawn Blanton;Vítor Grade Tavares
- 会议名称：《IEEE European Test Symposium》 | 2018年
- Instruments;
- Built-in self-test;
- Feature extraction;
- Integrated circuits;
- Compressed sensing;
- Machine learning;
- Standards;
16.Interconnect-aware tests to complement gate-exhaustive tests

机译：互连感知测试以补充门穷尽测试
- 作者：Irith Pomeranz;Srikanth Venkataraman
- 会议名称：《IEEE European Test Symposium》 | 2018年
- Logic gates;
- Circuit faults;
- Integrated circuit interconnections;
- Layout;
- Benchmark testing;
- Integrated circuit modeling;
17.BISTs for post-bond test and electrical analysis of high density 3D interconnect defects

机译：用于高密度3D互连缺陷的键合后测试和电分析的BOAT
- 作者：Imed Jani;Didier Lattard;Pascal Vivet;Lucile Arnaud;Edith Beigné
- 会议名称：《IEEE European Test Symposium》 | 2018年
- Integrated circuit interconnections;
- Bonding;
- Resistance;
- Three-dimensional displays;
- Delays;
- Built-in self-test;
- Instruments;
18.The impact of production defects on the soft-error tolerance of hardened latches

机译：生产缺陷对硬化闩锁的软错误容忍度的影响
- 作者：Stefan Holst;Ruijun Ma;Xiaoqing Wen
- 会议名称：《IEEE European Test Symposium》 | 2018年
- Latches;
- Production;
- Robustness;
- Feedback loop;
- Clocks;
- Transient analysis;
19.Model-based avionic systems testing for the airbus family

机译：空中客车家族基于模型的航空电子系统测试
- 作者：Jan Peleska
- 会议名称：《IEEE European Test Symposium》 | 2018年
- Testing;
- Switches;
- Aerospace electronics;
- Standards;
- Atmospheric modeling;
- Biological system modeling;
20.Sense amplifier offset characterisation and test implications for low-voltage SRAMs in 65 nm

机译：感测放大器失调特性及其对65 nm低压SRAM的测试意义
- 作者：Dhruv Patel;Derek Wright;Manoj Sachdev
- 会议名称：《IEEE European Test Symposium》 | 2018年
- Ions;
- Random access memory;
- Discharges (electric);
- Transistors;
- Leakage currents;
- Circuit faults;
- Testing;
21.Hardware Trojan detection using path delay order encoding with process variation tolerance

机译：使用具有过程变化容限的路径延迟顺序编码进行硬件木马检测
- 作者：Xiaotong Cui;Kaijie Wu;Ramesh Karri
- 会议名称：《IEEE European Test Symposium》 | 2018年
- Delays;
- Trojan horses;
- Encoding;
- Hardware;
- Fabrication;
- Foundries;
- Logic gates;
22.An efficient fault-tolerant valve-based microfluidic routing fabric for single-cell analysis

机译：一种高效的基于容错阀的微流路由结构，用于单细胞分析
- 作者：Yasamin Moradi;Krishnendu Chakrabarty;Ulf Schlichtmann
- 会议名称：《IEEE European Test Symposium》 | 2018年
- Fault tolerance;
- Fault tolerant systems;
- Fabrics;
- Routing;
- Cancer;
- Layout;
- Valves;
23.Device aging: A reliability and security concern

机译：设备老化：可靠性和安全性问题
- 作者：Daniel Kraak;Mottaqiallah Taouil;Said Hamdioui;Pieter Weckx;Francky Catthoor;Abhijit Chatterjee;Adit Singh;Hans-Joachim Wunderlich;Naghmeh Karimi
- 会议名称：《IEEE European Test Symposium》 | 2018年
- Degradation;
- Aging;
- Delays;
- Reliability;
- Decoding;
- Transistors;
24.Machine learning applications in IC testing

机译：机器学习在IC测试中的应用
- 作者：Haralampos-G. Stratigopoulos
- 会议名称：《IEEE European Test Symposium》 | 2018年
- Machine learning;
- Integrated circuits;
- Testing;
- Circuit faults;
- Training;
- Feature extraction;
- Task analysis;
25.Design and testing methodologies for true random number generators towards industry certification

机译：面向工业认证的真正随机数发生器的设计和测试方法
- 作者：Josep Balasch;Florent Bernard;Viktor Fischer;Miloš Grujić;Marek Laban;Oto Petura;Vladimir Rožić;Gerard van Battum;Ingrid Verbauwhede;Marnix Wakker;Bohan Yang
- 会议名称：《IEEE European Test Symposium》 | 2018年
- Entropy;
- Generators;
- Security;
- Phase locked loops;
- NIST;
- Clocks;
26.Design of fault-tolerant neuromorphic computing systems

机译：容错神经形态计算系统的设计
- 作者：Mengyun Liu;Lixue Xia;Yu Wang;Krishnendu Chakrabarty
- 会议名称：《》 | 2018年
- Memristors;
- Training;
- Resistance;
- Fault tolerance;
- Fault tolerant systems;
- Computer architecture;
- Neuromorphics;
27.Measuring mixed-signal test stimulus quality

机译：测量混合信号测试刺激质量
- 作者：Krzysztof Jurga;Stephen Sunter
- 会议名称：《IEEE European Test Symposium》 | 2018年
- Circuit faults;
- Resistors;
- Integrated circuit modeling;
- Voltage measurement;
- Threshold voltage;
- Analog circuits;
- Capacitance;
28.Towards the formal verification of security properties of a Network-on-Chip router

机译：正式验证片上网络路由器的安全性
- 作者：Johanna Sepulveda;Damian Aboul-Hassan;Georg Sigl;Bernd Becker;Matthias Sauer
- 会议名称：《IEEE European Test Symposium》 | 2018年
- Cryptography;
- Timing;
- Model checking;
- Routing;
- Hardware;
- IP networks;
29.Online prevention of security violations in reconfigurable scan networks

机译：在线预防可重新配置的扫描网络中的安全冲突
- 作者：Ahmed Atteya;Michael A. Kochte;Matthias Sauer;Pascal Raiola;Bernd Becker;Hans-Joachim Wunderlich
- 会议名称：《IEEE European Test Symposium》 | 2018年
- Instruments;
- Maintenance engineering;
- System-on-chip;
- Shift registers;
- Monitoring;
- Authentication;
30.IEEE Std P1838's flexible parallel port and its specification with Google's protocol buffers

机译：IEEE Std P1838的灵活并行端口及其带有Google协议缓冲区的规范
- 作者：Yu Li;Ming Shao;Hailong Jiao;Adam Cron;Sandeep Bhatia;Erik Jan Marinissen
- 会议名称：《IEEE European Test Symposium》 | 2018年
- IEEE Standards;
- Registers;
- Computer architecture;
- Clocks;
- Integrated circuit interconnections;
- Pipelines;
- Google;
31.Extending post-silicon coverage measurement using time-multiplexed FPGA overlays

机译：使用时分多路复用的FPGA覆盖范围扩展后硅覆盖率测量
- 作者：Fatemeh Eslami;Eddie Hung;Steven J.E. Wilton
- 会议名称：《IEEE European Test Symposium》 | 2018年
- Monitoring;
- Field programmable gate arrays;
- Instruments;
- Fabrics;
- System-on-chip;
- Computer architecture;
- Benchmark testing;
32.ReiNN: Efficient error resilience in artificial neural networks using encoded consistency checks

机译：ReiNN：使用编码一致性检查的人工神经网络中的有效错误恢复能力
- 作者：Sujay Pandey;Suvadeep Banerjee;Abhijit Chatterjee
- 会议名称：《IEEE European Test Symposium》 | 2018年
- Biological neural networks;
- Neurons;
- Engines;
- Fault tolerance;
- Fault tolerant systems;
- Resilience;
- Training;