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Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop

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1.Optimized digital compatible pulse sequences for testing of RF front end modules

机译：优化的数字兼容脉冲序列，用于测试射频前端模块
- 作者：Banerjee Aritra;Devarakond Shyam Kumar;Natarajan Vishwanath;Sen Shreyas;Chatterjee Abhijit
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
2.Test metric assessment of microfluidic systems through heterogeneous fault simulation

机译：通过非均质故障模拟评估微流体系统的测试指标
- 作者：Myers T.O.;Bell I.M.
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
- Levich sensors;
- component;
- fault analysis;
- fault injection;
- fault modeling;
- heterogeneous system simulation;
- impedance spectroscopy;
- microfluidic test;
3.Jitter characterization of incoherently sub-sampled high-speed digital signals

机译：非相干二次采样的高速数字信号的抖动特性
- 作者：Choi Hyun;Chatterjee Abhijit
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
4.Method of fabricating a convenient light source and its evaluation in PV cell laboratory testing

机译：便捷光源的制造方法及其在光伏电池实验室测试中的评估
- 作者：Aristizabal Jeydmer;Omrane Badr;Landrock Clint;Kaminska Bozena;Menon Carlo
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
5.Adaptive LUT-based system for in situ ADC auto-correction

机译：基于自适应LUT的ADC原位自动校正系统
- 作者：Bernard S.;Azais F.;Comte M.;Potin O.;Kerzerho V.;Renovell M.
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
6.Evaluation of built-in sensors for RF LNA response measurement

机译：评估用于RF LNA响应测量的内置传感器
- 作者：Tongbong J.;Abdallah L.;Mir S.;Stratigopoulos H.-G.
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
7.An adaptive BIST for INL estimation of ADCs without histogram evaluation

机译：无需直方图评估即可用于ADC的INL估计的自适应BIST
- 作者：Gines Antonio J.;Peralias Eduardo J.;Rueda Adoracion
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
- ADC static characterization;
- Built-in-Self Test (BIST);
- Digital adaptive blind test;
- INL;
- On-line testing;
8.A new method of charge-to-digital conversion

机译：电荷数字转换的新方法
- 作者：Koscielnik Dariusz;Miskowicz Marek
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
- asynchronous design;
- charge-to-digital conversion;
9.Simulating and monitoring the resonant frequency of MEMS for failure detection and prediction

机译：仿真和监视MEMS的谐振频率以进行故障检测和预测
- 作者：Jamborhazi Szilard;Hegedus Istvan;Rencz Marta
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
- failure detection;
- resonant frequency;
- simulation;
10.Extending a DWDM optical network test system to 10 Gbps ×4

机译：将DWDM光网络测试系统扩展到10 Gbps×4
- 作者：Keezer D.C.;Gray C.E.
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
- ATE;
- DWDM;
- high-speed digital test;
- jitter;
- multiplexing;
- picosecond;
- receiver;
- transmitter;
11.A Novel Feature Assisting in the Prediction of sEMG muscle fatigue towards a wearable autonomous system

机译：有助于预测sEMG肌肉对可穿戴自主系统疲劳的新功能
- 作者：Al-Mulla M.R.;Sepulveda F.
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
- 1D spectro;
- Transition-to-Fatigue;
- muscle fatigue;
- sEMG feature extraction;
12.PLL lock time prediction and parametric testing by lock waveform characterization

机译：通过锁定波形表征进行PLL锁定时间预测和参数测试
- 作者：Dasnurkar Sachin Dileep;Abraham Jacob A.
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
13.A comparison between voltage and true power based embedded measurements for RF testing

机译：射频测试中基于电压和有功功率的嵌入式测量之间的比较
- 作者：Mota Pedro;da Silva Jose Machado
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
14.Comparator based self-trim and self-test scheme for arbitrary analogue on-chip values

机译：基于比较器的自校正和自测试方案，用于任意模拟片上值
- 作者：von Staudt Hans Martin
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
- online-trim;
- self-test;
- self-trim by reference;
- self-tuning;
- trim DAC fault model;
15.Design and fabrication of a 3D pressure sensor

机译：3D压力传感器的设计与制造
- 作者：Nazeer S.;Martincic E.;Gilles JP.;Woytasik M.;Dufour-Gergam E.;Nikolovski JP.;Yousef H.
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
- 3D force measurement;
- flexible sensor;
- micromachining;
- tactile sensor;
16.Self-checking monitor for NBTI due degradation

机译：NBTI降级的自检监视器
- 作者：Omana M.;Rossi D.;Bosio N.;Metra C.
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
- NBTI degradation;
- critical data-path;
- monitor;
- selfchecking circuit;
17.Improved method for SNR prediction in machine-learning-based test

机译：基于机器学习的测试中SNR预测的改进方法
- 作者：Sheng Xiaoqin;Kerkhoff Hans G.
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
- ADC;
- SNR;
- double-ADC;
- machine-learning-based;
- pulse wave;
- test;
18.Dependable digitally-assisted mixed-signal IPs based on integrated self-test self-calibration

机译：基于集成的自测和自校准的可靠的数字辅助混合信号IP
- 作者：Kerkhoff Hans G.;Wan Jinbo
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
- aging;
- availability;
- dependability;
- mixedsignal testing;
- reliability;
- safety;
- self-calibration;
- self-repair;
- self-test;
19.ANC-based method for testing converters with random-phase harmonics

机译：基于ANC的具有随机相位谐波的变频器测试方法
- 作者：Kerzerho V.;Azais F.;Comte M.;Cauvet P.;Bernard S.;Renovell M.
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
- converter testing;
- harmonic characterization;
- random-phase harmonics;
20.Methodology of virtual testing of trimmable analog circuits

机译：可调整模拟电路的虚拟测试方法
- 作者：Sobe Udo;Bohme Enno;Roochy Karl-Heinz
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
- Precision Analog Circuits;
- Reference Blocks;
- Trimming Analysis;
- Verification;
- Virtual Testing;
21.Modeling the influence of etching defects on the sensitivity of MEMS convective accelerometers

机译：建模蚀刻缺陷对MEMS对流加速度计灵敏度的影响
- 作者：Rekik A.A.;Azais F.;Dumas N.;Mailly F.;Nouet P.
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
- MEMS;
- convective accelerometer;
- etching defects;
- fault modeling;
22.Guidelines for the efficient design of sinewave generators for analog/mixed-signal BIST

机译：用于模拟/混合信号BIST的正弦波发生器高效设计指南
- 作者：Barragan Manuel J.;Vazquez Diego;Rueda Adoracion;Huertas Jose Luis
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
23.AM-demodulation of analog/RF signals using digital tester channels

机译：使用数字测试仪通道对模拟/ RF信号进行AM解调
- 作者：Pous N.;Azais F.;Latorre L.;Rivoir Jochen
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
- AM demodulation;
- analog/RF circuits;
- coherent under-sampling;
- digital ATE;
- level-crossing;
- test;
24.DETECTOR: Design and test characterization of mixed-signal power cores

机译：检测器：混合信号功率核的设计和测试特性
- 作者：Moita Tiago H.;Almeida Carlos B.;dos Santos Marcelino B.
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
- Mixed-signal design;
- Mixed-signal test;
- Power Management Cores;
- Test automation;
25.MEMS for sensing high current overload

机译：MEMS用于感应大电流过载
- 作者：Kim Bruce C.;Kasim Rahim
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
- MEMS;
- MEMS circuit breaker;
- power distribution;
26.Read-Error-Rate evaluation for RFID system on-line testing

机译：RFID系统在线测试的读取错误率评估
- 作者：Fritz G.;Beroulle V.;Nguyen M.D;Aktouf O.;Parissis I.
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
27.Title pages

机译：标题页
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
28.Smart drivers for online diagnosis of electrostatic MEMS actuators

机译：在线诊断静电MEMS执行器的智能驱动器
- 作者：Dumas N.;Latorre L.;Mailly F.;Nouet P.
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
- CMOS;
- Diagnosis;
- Electrostatic Actuator;
- MEMS;
- Switch;
29.ADC testing with poly-harmonic signals

机译：使用多谐波信号进行ADC测试
- 作者：Vedral Josef
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
- ADC testing;
- AM and FM signal;
- effective number of bit;
- multi-tone signal;
- signal-to-noise and distortion;
- total harmonic distortion;
30.Optimized digital compatible pulse sequences for testing of RF front end modules

机译：优化的数字兼容脉冲序列，用于测试射频前端模块
- 作者：Banerjee A.;Kumar Devarakond S.;Natarajan V.;Sen S.;Chatterjee A.
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
31.Test metric assessment of microfluidic systems through heterogeneous fault simulation

机译：通过非均质故障模拟评估微流体系统的测试指标
- 作者：Myers T.O.;Bell I.M.
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
- Levich sensors;
- component;
- fault analysis;
- fault injection;
- fault modeling;
- heterogeneous system simulation;
- impedance spectroscopy;
- microfluidic test;
32.Jitter characterization of incoherently sub-sampled high-speed digital signals

机译：非相干二次采样的高速数字信号的抖动特性
- 作者：Hyun Choi;Chatterjee A.
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
33.Method of fabricating a convenient light source and its evaluation in PV cell laboratory testing

机译：便捷光源的制造方法及其在光伏电池实验室测试中的评估
- 作者：Aristizabal J.;Omrane B.;Landrock C.;Kaminska B.;Menon C.
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
34.Adaptive LUT-based system for in situ ADC auto-correction

机译：基于自适应LUT的ADC原位自动校正系统
- 作者：Bernard S.;Azaïs F.;Comte M.;Potin O.;Kerzérho V.;Renovell M.
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
35.Evaluation of built-in sensors for RF LNA response measurement

机译：评估用于RF LNA响应测量的内置传感器
- 作者：Tongbong J.;Abdallah L.;Mir S.;Stratigopoulos H.-G.
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
36.An adaptive BIST for INL estimation of ADCs without histogram evaluation

机译：无需直方图评估即可用于ADC的INL估计的自适应BIST
- 作者：Ginés A.J.;Peralías E.J.;Rueda A.
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
- ADC static characterization;
- Built-in-Self Test (BIST);
- Digital adaptive blind test;
- INL;
- On-line testing;
37.A new method of charge-to-digital conversion

机译：电荷数字转换的新方法
- 作者：Kóscielnik D.;Miśkowicz M.
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
- asynchronous design;
- charge-to-digital conversion;
38.Simulating and monitoring the resonant frequency of MEMS for failure detection and prediction

机译：仿真和监视MEMS的谐振频率以进行故障检测和预测
- 作者：Jámborházi S.;Hegedus I.;Rencz M.
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
- failure detection;
- resonant frequency;
- simulation;
39.Extending a DWDM optical network test system to 10 Gbps ×4

机译：将DWDM光网络测试系统扩展到10 Gbps×4
- 作者：Keezer D.C.;Gray C.E.
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
- ATE;
- DWDM;
- high-speed digital test;
- jitter;
- multiplexing;
- picosecond;
- receiver;
- transmitter;
40.A Novel Feature Assisting in the Prediction of sEMG muscle fatigue towards a wearable autonomous system

机译：有助于预测sEMG肌肉对可穿戴自主系统疲劳的新功能
- 作者：Al-Mulla M.R.;Sepulveda F.
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
- 1D spectro;
- Transition-to-Fatigue;
- muscle fatigue;
- sEMG feature extraction;
41.PLL lock time prediction and parametric testing by lock waveform characterization

机译：通过锁定波形表征进行PLL锁定时间预测和参数测试
- 作者：Dasnurkar S.D.;Abraham J.A.
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
42.A comparison between voltage and true power based embedded measurements for RF testing

机译：射频测试中基于电压和有功功率的嵌入式测量之间的比较
- 作者：Mota P.;da Silva J.M.
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
43.Comparator based self-trim and self-test scheme for arbitrary analogue on-chip values

机译：基于比较器的自校正和自测试方案，用于任意模拟片上值
- 作者：von Staudt H.M.
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
- online-trim;
- self-test;
- self-trim by reference;
- self-tuning;
- trim DAC fault model;
44.Design and fabrication of a 3D pressure sensor

机译：3D压力传感器的设计与制造
- 作者：Nazeer S.;Martincic E.;Gilles J.P.;Woytasik M.;Dufour-Gergam E.;Nikolovski J.P.;Yousef H.
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
- 3D force measurement;
- flexible sensor;
- micromachining;
- tactile sensor;
45.Self-checking monitor for NBTI due degradation

机译：NBTI降级的自检监视器
- 作者：Omana M.;Rossi D.;Bosio N.;Metra C.
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
- NBTI degradation;
- critical data-path;
- monitor;
- selfchecking circuit;
46.Improved method for SNR prediction in machine-learning-based test

机译：基于机器学习的测试中SNR预测的改进方法
- 作者：Xiaoqin Sheng;Kerkhoff H.G.
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
- ADC;
- SNR;
- double-ADC;
- machine-learning-based;
- pulse wave;
- test;
47.Dependable digitally-assisted mixed-signal IPs based on integrated self-test self-calibration

机译：基于集成的自测和自校准的可靠的数字辅助混合信号IP
- 作者：Kerkhoff H.G.;Jinbo Wan
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
- aging;
- availability;
- dependability;
- mixedsignal testing;
- reliability;
- safety;
- self-calibration;
- self-repair;
- self-test;
48.Smart drivers for online diagnosis of electrostatic MEMS actuators

机译：在线诊断静电MEMS执行器的智能驱动器
- 作者：Dumas N.;Latorre L.;Mailly F.;Nouet P.
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
- CMOS;
- Diagnosis;
- Electrostatic Actuator;
- MEMS;
- Switch;
49.ADC testing with poly-harmonic signals

机译：使用多谐波信号进行ADC测试
- 作者：Vedral J.
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
- ADC testing;
- AM and FM signal;
- effective number of bit;
- multi-tone signal;
- signal-to-noise and distortion;
- total harmonic distortion;
50.ANC-based method for testing converters with random-phase harmonics

机译：基于ANC的具有随机相位谐波的变频器测试方法
- 作者：Kerzérho V.;Azais F.;Comte M.;Cauvet P.;Bernard S.;Renovell M.
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
- converter testing;
- harmonic characterization;
- random-phase harmonics;
51.Methodology of virtual testing of trimmable analog circuits

机译：可调整模拟电路的虚拟测试方法
- 作者：Sobe U.;Bohme E.;Roochy K.-H.
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
- Precision Analog Circuits;
- Reference Blocks;
- Trimming Analysis;
- Verification;
- Virtual Testing;
52.Modeling the influence of etching defects on the sensitivity of MEMS convective accelerometers

机译：建模蚀刻缺陷对MEMS对流加速度计灵敏度的影响
- 作者：Rekik A.A.;Azais F.;Dumas N.;Mailly F.;Nouet P.
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
- MEMS;
- convective accelerometer;
- etching defects;
- fault modeling;
53.Guidelines for the efficient design of sinewave generators for analog/mixed-signal BIST

机译：用于模拟/混合信号BIST的正弦波发生器高效设计指南
- 作者：Barragán M.J.;Vázquez D.;Rueda A.;Huertas J.L.
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
54.AM-demodulation of analog/RF signals using digital tester channels

机译：使用数字测试仪通道对模拟/ RF信号进行AM解调
- 作者：Pous N.;Azaïs F.;Latorre L.;Rivoir J.
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
- AM demodulation;
- analog/RF circuits;
- coherent under-sampling;
- digital ATE;
- level-crossing;
- test;
55.DETECTOR: Design and test characterization of mixed-signal power cores

机译：检测器：混合信号功率核的设计和测试特性
- 作者：Moita T.H.;Almeida C.B.;dos Santos M.B.
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
- Mixed-signal design;
- Mixed-signal test;
- Power Management Cores;
- Test automation;
56.MEMS for sensing high current overload

机译：MEMS用于感应大电流过载
- 作者：Kim B.C.;Kasim R.
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
- MEMS;
- MEMS circuit breaker;
- power distribution;
57.Read-Error-Rate evaluation for RFID system on-line testing

机译：RFID系统在线测试的读取错误率评估
- 作者：Fritz G.;Beroulle V.;Nguyen M.D.;Aktouf O.;Parissis I.
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年
58.Title pages

机译：标题页
- 会议名称：《Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop》 | 2010年