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首页> 外文期刊>Thin Solid Films >Effects of acetylene flow rate and bias voltage on the structural and tribo- mechanical properties of sputtered a-C:H films
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Effects of acetylene flow rate and bias voltage on the structural and tribo- mechanical properties of sputtered a-C:H films

机译:乙炔流速和偏压对溅射A-C:H薄膜结构和摩擦性能的影响

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摘要

The properties of sputtered a-C:H films are significantly influenced by the C2H2 flow rate and bias voltage. A suitable Design of Experiments allows to consider their effects on the mechanical and tribological properties. The a-C:H films are deposited by varying the C2H2 flow rate from 5.9 to 34.1 sccm and the bias voltage from -83 to -197 V, following the Central Composite Design. In Raman scattering studies, the presence of C-H bands with increasing C2H2 flow rate is identified. Additionally, a decrease of the I(D)/I(G) ratio is observed with increasing C2H2 flow rate. Both observations indicate the formation of sp(3)-hybridized C-H bonds. In contrast, a low C2H2 flow rate and a high bias voltage result in a higher I(D)/I(G) ratio and a lower intensity of the C-H stretching bands, indicating a lower amount of C-H bonds. The mechanical properties are also considerably influenced by these parameters. A higher C2H2 proportion results in a lower hardness and elastic modulus, which are related to a higher H content. However, a higher bias voltage increases the hardness and elastic modulus due to densification mechanisms, which increase the degree of distortion of the a-C:H films. Consequently, a low C2H2 flow rate and a high bias voltage ensure a high hardness of up to similar to 24 GPa due to a lower amount of C-H bonds and a higher degree of distortion. In tribometer tests, most a-C:H films exhibit a low coefficient of friction against steel, ranging from 0.23 to 0.25. All a-C:H films are marked by a deformative wear, indicating a high resistance against abrasive wear when sliding against steel.
机译:溅射A-C:H膜的性质受C2H2流量和偏置电压的显着影响。合适的实验设计允许考虑它们对机械和摩擦学特性的影响。通过在中央复合设计之后,通过改变5.9至34.1 SCCM的C2H2流量和-83至-197 V的偏置电压来沉积A-C:H膜。在拉曼散射研究中,鉴定了C-H条带的存在随着C2H2流速的增加。另外,随着C2H2流速的增加,观察到I(d)/ i(g)比率的降低。两种观察结果表明SP(3) - 常规的C-H键的形成。相反,低C2H2流速和高偏置电压导致较高的I(D)/ I(G)比率和C-H拉伸带的较低强度,表示较低的C-H键。机械性能也受到这些参数的显着影响。较高的C2H2比例导致较低的硬度和弹性模量,其与较高的H含量有关。然而,较高的偏置电压增加了由于致密化机构引起的硬度和弹性模量,这增加了A-C:H薄膜的变形程度。因此,由于较低量的C-H键和更高的失真,低C2H2流速和高偏压的流速和高偏置电压确保高达24GPa的高硬度。在摩擦计试验中,大多数A-C:H薄膜对钢的摩擦系数低,范围为0.23至0.25。所有A-C:H薄膜由变形磨损标记,表示在滑动钢时对磨料磨损的高抗性。

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