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Structure and properties of WC-CrAlN superlattice films by cathodic arc ion plating process

机译:阴极电弧离子镀WC-CrAlN超晶格薄膜的结构与性能

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New WC-CrAIN superlattice films have been deposited on Si(100) substrate using a cathodic arc ion plating system. A substrate holder was rotated with a range from 1 to 12 rev./min to control the thickness of layered structures, and on arc power density of Al cathodes was controlled to change the Al concentration in the film. The microstructure and mechanical properties of the film depend on the superlattice period (λ) and Al concentration. The chemical composition was evaluated by glow discharge optical emission spectroscopy (GDOES). Using X-ray diffraction analysis (XRD), it is observed that the preferred orientation of microstructure is changed according to the superlattice periods (λ) and Al concentration. Through transmission electron microscope (TEM) analysis, the microstructure and superlattice period (λ) of the WC-CrAIN superlattice film were confirmed. The hardness of the deposited film was evaluated by a nanoindentation test. As a result of the nanoindentation test, the hardness of WC-CrAIN superlattice film gained approximately 40 GPa at the superlattice period (λ) of 7 nm. The structure of WC-CrAlN superlattice film was transformed from dense columnar structure to a nanocomposite structure.
机译:新的WC-CrAIN超晶格薄膜已使用阴极电弧离子镀系统沉积在Si(100)衬底上。衬底支架以1至12rev./min的范围旋转以控制层状结构的厚度,并且控制Al阴极的电弧功率密度以改变膜中的Al浓度。薄膜的微观结构和机械性能取决于超晶格周期(λ)和Al浓度。通过辉光放电发射光谱法(GDOES)评估化学成分。使用X射线衍射分析(XRD),可以观察到,根据超晶格周期(λ)和Al浓度的不同,微结构的首选取向也发生了变化。通过透射电子显微镜(TEM)分析,确认了WC-CrAIN超晶格薄膜的微观结构和超晶格周期(λ)。通过纳米压痕测试评价沉积膜的硬度。纳米压痕试验的结果是,在7nm的超晶格周期(λ)下,WC-CrAIN超晶格膜的硬度提高了约40GPa。 WC-CrAlN超晶格薄膜的结构从致密的柱状结构转变为纳米复合结构。

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