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Study of the interface in n~+ μc-Si/p-type c-Si heterojunctions: role of the fluorine chemistry in the interface passivation

机译:n〜+μc-Si/ p型c-Si异质结中界面的研究:氟化学在界面钝化中的作用

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Investigation of n-p heterojunction solar cells obtained by depositing a n-type thin silicon films either amorphous or microcrystalline on p-type c-Si is carried out. The study is focused on the improvement of the c-Si surface and emitter layer/c-Si substrate interface. The peculiarity is the use of SiF_4-based plasmas for the in situ dry cleaning and passivation of the c-Si surface and for the PECVD deposition of the emitter layer that can be either amorphous (a-Si:H,F) or microcrystalline (μc-Si). The use of SiF_4 instead of the conventional SiH_4 results in a lower hydrogen content in the film and in a reduction of the interaction of the c-Si surface with hydrogen atoms. Furthermore, the dependence of the heteroj unction solar cell photovoltaic parameters on the insertion of an intrinsic buffer layer between the n-type thin silicon layer and the p-type c-Si substrate is discussed.
机译:进行了通过在p型c-Si上沉积非晶或微晶n型硅薄膜获得的n-p异质结太阳能电池的研究。该研究集中在改善c-Si表面和发射极层/ c-Si衬底界面。特殊之处在于使用基于SiF_4的等离子体进行c-Si表面的原位干洗和钝化以及用于发射极层的PECVD沉积,该发射极层可以是非晶(a-Si:H,F)或微晶( μc-Si)。使用SiF_4代替常规的SiH_4会导致膜中的氢含量降低,并降低c-Si表面与氢原子的相互作用。此外,讨论了异质结太阳能电池光伏参数对本征缓冲层在n型薄硅层和p型c-Si衬底之间插入的依赖性。

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