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Determination of porosity of thin protective films on iron base materials and modelling of their development during aqueous corrosion

机译:铁基材料上薄保护膜孔隙率的确定及其在水腐蚀过程中的发展模型

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Corrosion properties of thin protective films on corroding substrates are dependent on the electrochemical properties of the substrate materials, the intrinsic corrosion properties of thin protective films and also on the films porosity. Therefore knowledge about the porosity is required in order to be able to control and optimise the deposition process. In this contribution a recently developed method to measure the porosity by means of an electrochemical technique is applied. As a model system thin iron films were deposited on silicon wafers and coated with amorphous carbon as a protective layer. The depositions were done by vacuum evaporation and ion assisted sputter deposition. Raman measurements, scanning electron microscopy, atomic force microscopy and electrochemical polarisation measurements were carried out to characterize the films. A model based on geometrical considerations is used to describe the development of the pores during corrosion. The measurement results show that the model is able to extract data on the pores.
机译:腐蚀的衬底上的保护膜的腐蚀性能取决于衬底材料的电化学性能,保护膜的固有腐蚀性能以及膜的孔隙率。因此,需要关于孔隙率的知识,以便能够控制和优化沉积过程。在该贡献中,应用了最近开发的通过电化学技术测量孔隙率的方法。作为模型系统,铁薄膜沉积在硅片上,并涂有非晶碳作为保护层。通过真空蒸发和离子辅助溅射沉积完成沉积。进行拉曼测量,扫描电子显微镜,原子力显微镜和电化学极化测量以表征膜。基于几何考虑的模型用于描述腐蚀过程中孔隙的发展。测量结果表明,该模型能够提取孔隙数据。

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