Far-infrared ellipsometry using a synchrotron light source―the dielectric response of the cuprate high T_c superconductors

摘要

We describe the setup of an ellipsometer for the far- to mid-infrared (FIR-MIR) spectral range that is used in combination with a Fourier-transform infrared (FTIR) spectrometer and a synchrotron light source. We present the outline of the ellipsometer and discuss how it has been optimized in order to perform accurate ellipsometric measurements on relatively small single crystals of the cuprate high-T_c superconductors (HTSC) and other oxide based compounds with strongly correlated charge carriers. We present ellipsometric spectra for the HTSC compounds Bi_2Sr_2CaCu_2O_(8+δ) and YBa_2Cu_3O_(6.95).