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Effect of substrate temperature on structural, electrical and optical properties of Al-N co-doped ZnO thin films

机译:衬底温度对Al-N共掺杂ZnO薄膜结构,电学和光学性能的影响

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摘要

The Al-N co-doped p-type ZnO thin films have been prepared by direct current magnetron reactive sputtering. Second ion mass spectroscopy tests proved that incorporation of Al facilitated N solution into ZnO, which promotes the formation of p-type conduction. With Al and N co-doping technique, we have observed a room temperature resistivity of 24.5 Omega cm and a hole concentration of 7.48 x 10(17) cm(-3) in ZnO thin films. A conversion from n-type conduction to p-type in a range of temperatures has been identified by the measurement of Hall effect and Spreading Resistance Profiles. X-ray diffraction measurements showed that the crystalinity of the Al-N co-doped ZnO thin films are also very dependent on the substrate temperature. (c) 2005 Elsevier B.V. All rights reserved.
机译:通过直流磁控反应溅射制备了Al-N共掺杂的p型ZnO薄膜。二次离子质谱测试证明,Al的掺入促进了ZnO中的N溶液,从而促进了p型传导的形成。使用Al和N共掺杂技术,我们已经观察到ZnO薄膜的室温电阻率为24.5 Omega cm,空穴浓度为7.48 x 10(17)cm(-3)。通过测量霍尔效应和扩展电阻曲线,可以确定在一定温度范围内从n型传导到p型的转换。 X射线衍射测量表明,Al-N共掺杂ZnO薄膜的结晶度也非常取决于衬底温度。 (c)2005 Elsevier B.V.保留所有权利。

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