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Hall sensors made of n-InSb/GaAs epitaxial layers for low temperature applications

机译:由n-InSb / GaAs外延层制成的霍尔传感器,用于低温应用

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摘要

Basic parameters of Hall sensor structures obtained from InSb thin films epitaxially grown on insulating GaAs are presented and discussed. The structures show very low temperature coefficients both of the input/output resistance, α, and the magnetic sensitivity, β, in the temperature range from 1.8 K to 280 K. They are α ≈ 10~(-4)/K and β ≈ 10~(-6)/K. The departure from the linearity of the Hall voltage, in the magnetic field range from 0.1 T to 14 T, is also low, of about 0.1%. The InSb layers do not show any Shubnikov-de Hass oscillations at 4.2. Ageing effects in the films are negligible.
机译:介绍并讨论了从绝缘GaAs上外延生长的InSb薄膜获得的霍尔传感器结构的基本参数。这些结构在1.8 K至280 K的温度范围内均显示出非常低的温度系数,包括输入/​​输出电阻α和磁灵敏度β。它们分别为α≈10〜(-4)/ K和β≈ 10〜(-6)/ K。在0.1 T至14 T的磁场范围内,霍尔电压线性度的偏离也很小,约为0.1%。 InSb层在4.2处未显示任何Shubnikov-de Hass振荡。膜中的老化作用可以忽略不计。

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