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首页> 外文期刊>Thin Solid Films >Study of argon additive in a beam injection type negative ion source using VUV emission spectroscopy
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Study of argon additive in a beam injection type negative ion source using VUV emission spectroscopy

机译:射束注入型负离子源中氩气添加剂的VUV发射光谱研究

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摘要

Effects of Ar addition are studied by using a beam injection type negative ion source. With adding Ar, I_(H~-) increases at low base H_2 pressure. At high base H_2 pressure, however, I_(H~-) decreases. VUV emission intensities also decrease at high base pressure. In other words, Ar addition is adverse effect for production of H_2 (v"). Therefore, decrease in I_(H~-) is caused by decrease in H_2 (v"). In D_2 plasmas, variation patterns of plasma parameters and VUV intensities by Ar addition are nearly the same as ones in H_2 plasmas. Even in low base pressure, however, enhancement of I_(D~-) is not observed.
机译:通过使用射束注入型负离子源研究了添加Ar的效果。随着Ar的加入,I_(H〜-)在低的基础H_2压力下增加。但是,在高的基本H_2压力下,I_(H〜-)减小。在高基本压力下,VUV发射强度也会降低。换句话说,添加Ar对H_2(v″)的产生是不利的。因此,I_(H〜-)的降低是由H_2(v″)的降低引起的。在D_2等离子体中,通过添加Ar引起的等离子体参数和VUV强度的变化规律与在H_2等离子体中几乎相同。但是,即使在低基础压力下,也没有观察到I_(D〜-)的增加。

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