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Uniform CoSi_2 nano-nucleus formation by oxide mediated silicidation with a Ti capping layer

机译:Ti覆盖层通过氧化物介导的硅化作用形成均匀的CoSi_2纳米核

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摘要

The nucleation stage toward CoSi_2 with average island size of about 4 nm and uniform island size distribution is obtained from a TiN/Co/ Ti/Co/SiO_x/Si multilayer with the SiO_x as a mediated layer by annealing at 460℃ for 240 s followed by 600℃ 240 s. It is found that Ti capping layer can enhance Co diffusion into the Si substrate at higher temperature (600℃ 240 s) annealing, which results in larger nucleus size (average grain size about 12 nm) but nonuniform nucleus size distribution. However, two-step annealing for 460℃ 240 s followed by 600℃ 240 s results in a smaller average nucleus size with better nucleus size distribution. The mechanism responsible for the discrepancy is discussed in the paper.
机译:通过以SiO_x为介导层的TiN / Co / Ti / Co / SiO_x / Si多层膜在460℃下退火240 s,获得了向CoSi_2的成核阶段,平均岛尺寸约为4 nm,岛尺寸分布均匀。在600℃下240 s。结果表明,Ti覆盖层可以在较高的温度(600℃240 s)退火下促进Co扩散到Si衬底中,从而导致更大的核尺寸(平均晶粒尺寸约为12 nm),但核尺寸分布不均匀。但是,在460℃240 s进行两步退火,然后在600℃240 s进行两步退火,可以得到较小的平均核尺寸,并具有更好的核尺寸分布。本文讨论了造成差异的机制。

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