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首页> 外文期刊>Thin Solid Films >Preparation of visible-light-active Ag and In-doped ZnS thin film photoelectrodes by reactive magnetron co-sputtering
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Preparation of visible-light-active Ag and In-doped ZnS thin film photoelectrodes by reactive magnetron co-sputtering

机译:反应磁控共溅射制备可见光活性Ag和In掺杂ZnS薄膜光电电极

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Ag and In-doped ZnS thin films were prepared by direct current and radio frequency reactive co-sputtering of a zinc target and an indium target covered by Ag wires in gas mixtures of argon and hydrogen sulfide. The influences of the various deposition parameters on the structural, optical and electrical performances of thin films as visible-light-active photoelectrodes have been investigated. The X-ray diffraction data revealed that the polycrystalline (Ag, In, Zn)S thin films contain mixed structures of AgIn_5S_8 and ZnS. The images from an atomic force microscopy showed that the surface roughness was significantly increased with incremental increases of plasma power, resulting in increases of the refractive index and the reduction in photocurrent. The film deposited in the optimal deposition parameters, DC and RF powers at 50 W using a hydrogen sulfide ratio of 0.40 with a substrate temperature of 300 ℃, exhibits the smallest refractive index, highest donor density, and the highest photocurrent density under illumination with a solar simulator (AM 1.5) at +1.00 V vs. Ag/AgCl. The band-gap energies of as-prepared films are found to be in the range of 2.28 to 2.39 eV and flat-band potentials determined by application of the Mott-Schottky equation vary from -0.55 to -0.68 V versus normal hydrogen electrode.
机译:Ag和In掺杂的ZnS薄膜是通过在氩气和硫化氢的气体混合物中通过直流电和射频反应性溅射由银线覆盖的锌靶和铟靶制备的。研究了各种沉积参数对作为可见光活性光电电极的薄膜的结构,光学和电学性能的影响。 X射线衍射数据表明,多晶(Ag,In,Zn)S薄膜包含AgIn_5S_8和ZnS的混合结构。来自原子力显微镜的图像显示,表面粗糙度随着等离子功率的增加而显着增加,从而导致折射率增加和光电流减小。在最佳沉积参数下(直流和射频功率为50W,硫化氢比为0.40,衬底温度为300℃)沉积的膜在光照下表现出最小的折射率,最高的施主密度和最高的光电流密度。太阳模拟器(AM 1.5)在+1.00 V对Ag / AgCl的条件下。发现所制备的膜的带隙能量在2.28至2.39eV的范围内,并且通过应用Mott-Schottky方程确定的平坦带电势相对于正常氢电极在-0.55至-0.68V之间变化。

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