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CdTe-CdS solar cells - Production in a new baseline and investigation of material properties

机译:CdTe-CdS太阳能电池-以新的基准生产和材料性能研究

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In this paper, we describe our new baseline for CSS-CdTe-CdS solar cells on 10 × 10 cm~2 substrates. The deposition of the p-n junction and all the following steps were performed at the Institut fuer Festkorperphysik (IFK) in Jena. Using the new baseline, we are already able to produce solar cells with similar properties as commercial ones. In the batch type process, all manufacturing steps can be investigated separately. We employ Rutherford backscattering spectrometry (RBS), X-ray diffraction (XRD) and external quantum efficiency (EQE) measurements to characterise the structure of the bulk materials and interfaces. It is demonstrated that by RBS the front contact becomes accessible for thinned CdTe films. At the back contact, RBS spectra show a tellurium accumulation which is due to etching. This tellurium rich layer is confirmed by XRD with Rietveld refinement. The intermixing at the CdS-CdTe interface caused by the activation step is quantified by a bandgap determination based on EQE measurements. From the bandgap energy of the CdTe_(1-x)S_x compound, we calculated the sulphur fraction x at the interface. XRD measurements imply that the activation step induces a (111) texture in CdTe. With regard to an improved manufacturing process, our cells are compared to industrial cells produced by Antec Solar Energy.
机译:在本文中,我们描述了在10×10 cm〜2的基板上CSS-CdTe-CdS太阳能电池的新基线。 p-n结的沉积以及所有后续步骤都是在耶拿的Festkorperphysik研究所(IFK)进行的。使用新的基准,我们已经能够生产出与商业性质相似的太阳能电池。在批处理过程中,可以单独研究所有制造步骤。我们采用卢瑟福背散射光谱(RBS),X射线衍射(XRD)和外部量子效率(EQE)测量来表征散装材料和界面的结构。通过RBS证明,前接触点可用于变薄的CdTe薄膜。在背接触处,RBS光谱显示出由于蚀刻而导致的碲积累。 XRD通过Rietveld精炼证实了该富碲层。通过基于EQE测量的带隙确定来量化由激活步骤引起的CdS-CdTe界面处的混合。根据CdTe_(1-x)S_x化合物的带隙能,我们计算了界面处的硫含量x。 XRD测量表明激活步骤在CdTe中诱导(111)织构。关于改进的制造工艺,我们的电池与Antec Solar Energy生产的工业电池进行了比较。

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