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On the band diagram of Mg_2Si/Si heterojunction as deduced from optical constants dispersions

机译:由光学常数色散推导的Mg_2Si / Si异质结的能带图

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The optical constant dispersions of ion-beam-synthesized Mg_2Si phase in Si matrix are obtained from the transmittance and reflectance spectra. Two types of samples are studied - one of them with Mg_2Si phase embedded in n-type (100)Si and the other with Mg_2Si phase embedded in ρ-type (100)Si. The formation of the phase is proved by Raman scattering and infrared transmittance measurements. From the interpretation of the optical constant dispersions, the energies of the transitions nearby the material band edge are determined. As a result the band diagram of the heterojunction Mg_2Si/Si is obtained. The results about the Mg_2Si band gap value are compared with the theoretically predicted and experimentally determined ones. The value of the conduction band offsets of Mg-2Si and Si is not reported by now.
机译:由透射和反射光谱得到离子束合成的Mg_2Si相在Si基体中的光学常数色散。研究了两种类型的样品-一种是将Mg_2Si相嵌入n型(100)Si中,另一种是将Mg_2Si相嵌入ρ型(100)Si中。通过拉曼散射和红外透射率测量证明了相的形成。通过对光学常数色散的解释,可以确定材料带边缘附近的跃迁能量。结果,获得了异质结Mg_2Si / Si的能带图。将有关Mg_2Si带隙值的结果与理论预测和实验确定的结果进行比较。目前尚无Mg-2Si和Si的导带偏移值。

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