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首页> 外文期刊>Thin Solid Films >Surface modification of indium tin oxide anodes by self-assembly monolayers: Effects on interfacial morphology and charge injection in organic light-emitting diodes
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Surface modification of indium tin oxide anodes by self-assembly monolayers: Effects on interfacial morphology and charge injection in organic light-emitting diodes

机译:自组装单层氧化铟锡阳极的表面改性:对有机发光二极管界面形态和电荷注入的影响

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摘要

Three silane derivatives including dodecyltrichlorosilane (DDTS), phenyltriethoxysilane (PTES) and 3-aminopropyl-methyl-diethoxysilane (APMDS) were used to modify the indium tin oxide (ITO) surfaces. The effects of various terminal groups of the self-assembled monolayers (SAMs) on the growth behavior and interfacial morphologies of N,N'-di(naphthalene-1-yl)-N,N'-diphenylbenzidine (NPB) film deposited on the SAM-modified ITO were studied, as well as their effects on the performance of organic light-emitting diodes (OLED) devices. The results show that the growth behavior of NPB film over-deposited on the SAM-modified ITO is mainly determined by the wettability of the surface. The covering ability and thermal stability of NPB film on the SAM-modified ITO decrease in the order: bare ITO > ITO/PTES > ITO/APMDS > ITO/ DDTS. However, the covering characteristic of NPB films on these substrates did not show direct relation to the transport of carriers across the anode/NPB interface as evaluated from the cyclic voltammogram and OLED performance. The turn-on voltages for these SMA-modified OLED devices increase in the order: ITO/PTES < ITO/DDTS ≤ bare ITO < ITO/APMDS. The enhancing effect of PTES on the hole injection is ascribed to the similar structure of PTES to NPB. On the contrary, the inhibition effect of APMDS is caused from the interaction of the lone-pair electrons of amine group to the transport carriers. Since these devices are known to be hole dominant, the luminance efficiency increase in a similar order as that for the turn-on voltage: ITO/PTES < ITO/DDTS ≤ bare ITO < ITO/APMDS.
机译:包括十二烷基三氯硅烷(DDTS),苯基三乙氧基硅烷(PTES)和3-氨基丙基-甲基二乙氧基硅烷(APMDS)在内的三种硅烷衍生物用于修饰氧化铟锡(ITO)表面。自组装单分子膜(SAMs)的各个末端基团对沉积在膜上的N,N'-二(萘-1-基)-N,N'-二苯基联苯胺(NPB)膜的生长行为和界面形态的影响研究了SAM改性的ITO及其对有机发光二极管(OLED)器件性能的影响。结果表明,过量沉积在SAM改性ITO上的NPB薄膜的生长行为主要取决于表面的润湿性。 NPB膜在SAM改性ITO上的覆盖能力和热稳定性依次降低:裸ITO> ITO / PTES> ITO / APMDS> ITO / DDTS。但是,从循环伏安图和OLED性能评估,这些基板上NPB薄膜的覆盖特性并未显示出与载流子跨阳极/ NPB界面的传输有直接关系。这些SMA改性OLED器件的开启电压按以下顺序增加:ITO / PTES

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