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Performance And Reliability Of Sige Photodetectors

机译:Sige光电探测器的性能和可靠性

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摘要

Ge on Si p-i-n photodetectors with areas which are compatible with commercially-available receivers have been fabricated and tested. A dark current density of 6 mA/cm~2 at -1 V bias has been measured at room temperature; when heated to 85 ℃, the measured dark current increases by a factor of nine. A responsivity of 0.59 A/W at 850 nm has been measured from these Ge detectors, which matches or exceeds commercially available GaAs devices. We have measured bandwidths approaching 9 GHz at -2 V bias from 50 μm diameter Ge detectors.
机译:已经制造并测试了具有与市售接收器兼容的面积的Si p-i-n光电探测器上的Ge。室温下在-1 V偏压下测得的暗电流密度为6 mA / cm〜2;当加热到85℃时,测得的暗电流增加了九倍。从这些Ge探测器测得在850 nm处的响应度为0.59 A / W,与市场上可买到的GaAs器件相匹配或超过。我们已经从直径50μm的Ge检测器测量到在-2 V偏置下接近9 GHz的带宽。

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