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Low temperature synthesis of ITO thin film on polymer in Ar/H_2 plasma by pulsed DC magnetron sputtering

机译:脉冲直流磁控溅射在Ar / H_2等离子体中在聚合物上低温合成ITO薄膜

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摘要

Indium tin oxide (ITO) films were synthesized on polymer (PES, polyethersulfone) at low temperature less than 100 ℃ by pulsed DC magnetron sputtering. The microstructure evolution of ITO thin film was investigated by employing the hydrogen gas in Ar discharge. The discharge behavior with hydrogen gas addition was analyzed by optical emission spectroscopy (OES) and microstructure change was investigated by XRD and TEM. It could be confirmed that the discharge with a mixture gas of hydrogen and Ar made an effect on the ionization of indium and oxygen gases as measured by OES and also significantly promoted the formation of crystallites of ITO in amorphous matrix. As a result, the resistivity of ITO film was significantly improved to 5.27 × 10~(-4) Ω·cm at 0.026 Pa of hydrogen partial pressure below 100 ℃ in comparison with 2.65 × 10~(-3) Ω·cm under hydrogen free condition.
机译:脉冲直流磁控溅射在不到100℃的低温下,在聚合物(PES,聚醚砜)上合成了氧化铟锡(ITO)薄膜。利用氢气在氩气放电中研究了ITO薄膜的微观结构演变。通过光学发射光谱法(OES)分析了添加氢气后的放电行为,并通过XRD和TEM研究了微观结构的变化。可以证实,通过OES测量,用氢气和Ar的混合气体放电对铟和氧气的电离产生影响,并且还显着促进了非晶态基质中ITO的微晶形成。结果,与氢气下的2.65×10〜(-3)Ω·cm相比,在100℃以下的氢气分压为0.026 Pa时,ITO膜的电阻率显着提高到5.27×10〜(-4)Ω·cm。自由状态。

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