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Room temperature crystallization by RF plasma

机译:射频等离子体在室温下结晶

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The crystallization of amorphous thin films was achieved by radiofrequency (RF) plasma treatment. Although various amorphous films are crystallized after 2 min or so, the sample temperature is lower than 150 ℃ without compulsory cooling even when the films are treated for 1 h. This treatment works on amorphous films of various materials, independently of the film preparation method and substrate materials. Sol-gel-derived TiO_2 films were densified and simultaneously crystallized to anatase structure by the plasma treatment and the obtained films indicate almost the same photocatalytic activities as that of thermally crystallized TiO_2 films. Plasma-crystallized sputtered indium tin oxide (ITO) films have a bixbite structure and the resistivity reached to 1.6 × 10~4 ft cm while the crystallization condition was not optimized. Amorphous silicon films with a small mount of crystallites were deposited by sputtering method and were crystallized by the plasma treatment.
机译:无定形薄膜的结晶是通过射频(RF)等离子体处理实现的。尽管各种非晶膜在2分钟左右后便会结晶,但即使将膜处理1小时,样品温度仍低于150℃,而无需强制冷却。该处理对各种材料的非晶膜均有效,与膜的制备方法和基材无关。通过等离子体处理使溶胶-凝胶衍生的TiO_2薄膜致密并同时结晶为锐钛矿结构,所得薄膜显示出与热结晶TiO_2薄膜几乎相同的光催化活性。等离子晶化溅射铟锡氧化物(ITO)膜具有bixbite结构,电阻率达到1.6×10〜4 ft cm,而晶化条件并未得到优化。通过溅射法沉积具有少量晶体的非晶硅膜,并通过等离子体处理使其结晶。

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