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Properties of (K,Na)NbO_3-based lead-free piezoelectric films prepared by pulsed laser deposition

机译:脉冲激光沉积制备(K,Na)NbO_3基无铅压电薄膜的性能

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摘要

To investigate the properties of (K,Na)NbO_3-based lead-free piezoelectric films at the morphotropic phase boundary composition, we fabricated epitaxial [(K_(0.5)Na_(0.5))_(0.97)Li_(0.03)] (Nb_(0.8)Ta_(0.2))O_3 films on (001), (110) and (111)-oriented single crystal SrTiO_3 substrates by pulsed laser deposition. The structure and electrical properties of the films were studied. Dielectric constants of 540, 390 and 300 and remnant polarizations of 4.00,1.05, and 0.35μC/cm~2 were observed for the (001), (110) and (111) oriented films, respectively.
机译:为了研究(K,Na)NbO_3基无铅压电薄膜在同相相界组成下的性能,我们制备了外延[[K_(0.5)Na_(0.5))_(0.97)Li_(0.03)](Nb_通过脉冲激光沉积在(001),(110)和(111)取向的单晶SrTiO_3衬底上的(0.8)Ta_(0.2))O_3膜。研究了薄膜的结构和电性能。 (001),(110)和(111)取向膜的介电常数分别为540、390和300,残余极化分别为4.00、1.05和0.35μC/ cm〜2。

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  • 来源
    《Thin Solid Films》 |2010年第23期|p.6777-6780|共4页
  • 作者单位

    School of Materials Science and Engineering, Nanyang Technological University, Singapore 639798, Singapore;

    rnSchool of Materials Science and Engineering, Nanyang Technological University, Singapore 639798, Singapore;

    rnSchool of Materials Science and Engineering, Nanyang Technological University, Singapore 639798, Singapore;

    rnSchool of Materials Science and Engineering, Nanyang Technological University, Singapore 639798, Singapore;

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  • 正文语种 eng
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  • 关键词

    lead-free piezoelectric; (K,Na)NbO_3; morphotropic phase boundary; X-ray diffraction; dielectric properties;

    机译:无铅压电;(K;Na)NbO_3;形态相界X射线衍射;介电性能;

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